Results 91 to 100 of about 17,558 (314)

Application for system reliabilty evaluation using fault tree analysis

open access: yes, 2019
Tato bakalářská práce se zabývá metodou stromu poruchových stavů a vytvoření aplikace, která tuto metodu implementuje. Jde o metodu používanou pro ohodnocení spolehlivosti libovolného systému. Práce se zaměřuje na popis a postup metody stromu poruchových
Fengl, Vlastimil
core   +1 more source

Fault Tree Analysis Untuk Meningkatkan Kualitas Produk [PDF]

open access: yes, 2004
Nowdays the competition on business field is so tight. Companies compete to be the winner on that competition. Competition is done by increase the quality of their product. Because now is the era of quality.
Suhardi, Bambang
core  

Research on Fault Tree Reconstruction Based on Contingency

open access: yes, 2022
The fault tree analysis (FTA) method is an important analysis method for safety system engineering. Traditional accident analysis theory agrees that basic events lead to top events, but it does not fully consider that the accident process is accidental ...
Xiaozhen Zhu   +3 more
core   +1 more source

Fuzzy Fault Trees Formalized

open access: yesCoRR
Fault tree analysis is a vital method of assessing safety risks. It helps to identify potential causes of accidents, assess their likelihood and severity, and suggest preventive measures. Quantitative analysis of fault trees is often done via the dependability metrics that compute the system's failure behaviour over time.
Thi Kim Nhung Dang   +2 more
openaire   +3 more sources

Fault trees on a diet: automated reduction by graph rewriting

open access: yesFormal Aspects of Computing, 2017
Abstract Fault trees are a popular industrial technique for reliability modelling and analysis. Their extension with common reliability patterns, such as spare management, functional dependencies, and sequencing—known as dynamic fault trees (DFTs)—has an adverse effect on scalability, prohibiting the ...
Sebastian Junges   +4 more
openaire   +4 more sources

Mechanical Behavior and Fracture Mechanisms of MXene/PVDF Nanocomponsites: In Situ Characterization and Multiscale Analysis

open access: yesAdvanced Functional Materials, EarlyView.
Multiscale experiments and modeling reveal how Ti3C2Tx MXene nanosheets reinforce PVDF nanocomposites. An optimal MXene loading (∼1 wt.%) nearly doubles tensile strength through efficient stress transfer, flake alignment, and crack‐deflection mechanisms, transforming ductile polymer behavior into a controlled multi‐stage fracture pathway which aligns ...
Bita Soltan Mohammadlou   +5 more
wiley   +1 more source

The fault-tree compiler

open access: yes, 1987
The Fault Tree Compiler Program is a new reliability tool used to predict the top event probability for a fault tree. Five different gate types are allowed in the fault tree: AND, OR, EXCLUSIVE OR, INVERT, and M OF N gates.
Martensen, Anna L., Butler, Ricky W.
core   +1 more source

Fuzzy Fault Trees: the Fast and the Formal

open access: yes
Preprint version, containing an appendix with proofs, of the conference paper with the DOI below; presented at QEST+FORMATS 2025. (This replacement corrects the faulty DOI from the previous version and updates this comment field.)
Thi Kim Nhung Dang   +3 more
openaire   +4 more sources

Optoelectronic Synaptic Devices Using Molecular Telluride Phase‐Change Inks for Three‐Factor Learning

open access: yesAdvanced Functional Materials, EarlyView.
Optoelectronic synaptic devices based on solution‐processed molecular telluride GST‐225 phase‐change inks are demonstrated for three‐factor learning. A global optical signal broadcast through a silicon waveguide induces non‐volatile conductance updates exclusively in locally electrically flagged memristors.
Kevin Portner   +14 more
wiley   +1 more source

Oxygen‐Tunnel Indium Tin Oxide Vertical Channel Transistors with Enhanced Current Density and Reliability for Monolithic 3D Compute‐In‐Memory Systems

open access: yesAdvanced Functional Materials, EarlyView.
Oxygen‐tunnel (OT) indium tin oxide (ITO) vertical channel transistors (VCTs) enable reliable, high‐density gain‐cell memory for monolithic 3D integration. A sandwiched SiN/SiO2/SiN OT stack selectively regulates oxygen transport, suppressing parasitic electrode oxidation while stabilizing channel oxygen vacancies, thereby suppressing carrier injection
Hyeonho Gu   +17 more
wiley   +1 more source

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