Results 81 to 90 of about 10,845 (267)

Diagnosis of Faults in Linear Tree Networks

open access: yesIEEE Transactions on Computers, 1977
The problem of fault detection and location in tree networks of two-input EXCLUSIVE-OR (EOR) gates is considered. The fault model assumes that an EOR gate can change to any other function of its two inputs except the Equivalence function. An efficient procedure for single fault location is presented.
Seth, Sharad C., Kodandapani, K. L.
openaire   +2 more sources

The Influence of Field‐Assisted Sintering Technology (FAST) Temperature and Cooling Rate on the Microstructural Evolution in Gamma‐Titanium Aluminide Alloy GE4822

open access: yesAdvanced Engineering Materials, EarlyView.
Controlling the Field Assisted Sintering Technology (FAST) parameters, dwell temperature and cooling rate, significantly influences the microstructural evolution in titanium aluminide GE4822. Significant γ‐lamellar colonies develop only upon cooling through the α‐transus.
Jack Krohn, James Pepper, Martin Jackson
wiley   +1 more source

Decision Fault Tree Learning and Differential Lyapunov Optimal Control for Path Tracking. [PDF]

open access: yesEntropy (Basel), 2023
Bose SSC   +5 more
europepmc   +1 more source

Advances in component fault trees

open access: yes, 2018
Component Fault Trees (CFTs) were invented in 2003 as a compositional extension to fault trees to better reflect the technical architecture of a system in its safety analysis model. Since then, a lot of research has been contributed regarding semantic extensions, evaluation techniques, and tighter linking between system and safety models.
Bernhard, Kaiser   +8 more
openaire   +2 more sources

Uniform Amorphization of Crystalline Silicon Surfaces Enabled by Deep Ultraviolet Femtosecond Laser Pulses

open access: yesAdvanced Engineering Materials, EarlyView.
Deep‐UV (258 nm) femtosecond pulses enable uniform amorphous silicon writing on Si(100)/(111) with a six‐fold larger fluence amorphization window than NIR methods. Optimized fluence and overlap yield 20–45 nm uniform and continuous amorphous layers. Microscopy shows sharp interfaces, and real‐time reflectivity reveals nanosecond melt–resolidification ...
Wissal Benali   +5 more
wiley   +1 more source

Decision tree-based fault diagnosis system for distribution network fault indicators

open access: yesJournal of Engineering and Applied Science
As a widely used fault detection equipment in distribution networks, the distribution network fault indicator plays an important role in timely fault judgment and power supply recovery. Therefore, when designing distribution network lines, the quality of
Qingsheng Tian   +6 more
doaj   +1 more source

Optoelectronic Synaptic Devices Using Molecular Telluride Phase‐Change Inks for Three‐Factor Learning

open access: yesAdvanced Functional Materials, EarlyView.
Optoelectronic synaptic devices based on solution‐processed molecular telluride GST‐225 phase‐change inks are demonstrated for three‐factor learning. A global optical signal broadcast through a silicon waveguide induces non‐volatile conductance updates exclusively in locally electrically flagged memristors.
Kevin Portner   +14 more
wiley   +1 more source

Home - About - Disclaimer - Privacy