Results 171 to 180 of about 21,239 (224)

A Physics‐Based Compact Model for Ferroelectric Capacitors Operating Down to Deep Cryogenic Temperatures for Applications in Analog Memory and Neuromorphic Architectures

open access: yesAdvanced Electronic Materials, EarlyView.
A compact model for ferroelectric thin‐film capacitors operating under different electric fields and temperatures is reported. The model can reproduce polarization switching down to 4 K, making them suitable for quantum computing and space technologies.
Ella Paasio   +2 more
wiley   +1 more source

Ge N‐Channel Ferroelectric FET Memory With Al2O3/AlN Interfacial Layer by Microwave Annealing

open access: yesAdvanced Electronic Materials, EarlyView.
The first Ge n‐channel FeFET memory devices have been demonstrated. By employing an Al2O3/AlN interfacial layer combined with low thermal budget microwaving annealing, a desirable memory window as well as triple‐level cell storage capability with good reliability have been achieved.
Sheng‐Yen Zheng   +3 more
wiley   +1 more source

Ambient Moisture-Induced Self Alignment of Polarization in Ferroelectric Hafnia. [PDF]

open access: yesAdv Sci (Weinh)
Wei LQ   +9 more
europepmc   +1 more source

Wearable PZT Piezoelectric Sensor Device for Accurate Arterial Pressure Pulse Waveform Measurement

open access: yesAdvanced Electronic Materials, EarlyView.
This work presents a wearable device for the non‐invasive measurement of radial arterial pressure pulse waveforms, incorporating a highly sensitive flexible Lead Zirconate Titanate (PZT) piezoelectric sensor and an optimized tightness‐free attachment method to maximize the sensitivity.
Minyu Li   +3 more
wiley   +1 more source

Overcoming Endurance Limitations in Organic Nonvolatile Memories Through N‐Type Small‐Molecule Semiconductor Implementation and Thermal Optimization

open access: yesAdvanced Electronic Materials, EarlyView.
The defects in the charge‐trapping layer are believed to be responsible for endurance degradation in organic transistor nonvolatile memory (ONVM). The ONVM employing thermally treated n‐type semiconductor as the charge‐storage layer can maintain prolonged stable endurance for up to 104 cycles through annealing the charge‐trapping layer, paving the way ...
Zhenliang Liu   +8 more
wiley   +1 more source

Room-temperature ferroelectric, piezoelectric and resistive switching behaviors of single-element Te nanowires. [PDF]

open access: yesNat Commun
Zhang J   +19 more
europepmc   +1 more source

Oxygen Doping in Ferroelectric Wurtzite‐type Al0.73Sc0.27N: Improved Leakage and Polarity Control

open access: yesAdvanced Electronic Materials, EarlyView.
Left: Polarization hysteresis (P‐E) characteristics of 200 nm wurtzite‐type Al0.73Sc0.27N without (ref. Nmix = 0) and with O‐doping (Nmix = 8 and 15), showing a clear drop of leakage current with O‐doping. Right: Piezoresponse for microscopy showing the as‐deposited polarization reversal from nitrogen (Nmix = 0) to metal polarity (Nmix = 15) via mixed ...
Md Redwanul Islam   +11 more
wiley   +1 more source

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