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High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns

open access: yesSmall Structures, Volume 7, Issue 2, February 2026.
In this high‐fidelity dehydration and low‐artifact scanning electron microscopy (SEM) analysis method for DNA brick‐based crystalline films, Ni2+ ions suppress dehydration‐induced deformation of DNA nanopatterns on solid substrates and form semiconducting nickel phosphate derivatives, enhancing electrical and thermal conductivity.
Ruoyu Dai   +6 more
wiley   +1 more source
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