The measurement errors of X-ray devices features
Expressions for calculating the measurement errors of X-ray devices features are given as follows: mean photon energy, homogeneity coefficient, the first and the second half-value layer (1st HVL, 2nd HVL). Comparison of errors is organized at measurement
S. A. Dushkin +4 more
doaj
In this work, the mass attenuation coefficient, effective atomic number and half value layer parameters were calculated for silicate (SiO2) mixed with various levels of lead oxide and iron oxide as reinforced materials. SiO2 was used with different
Abbas J. Al-Saadi, Abbas K. Saadon
doaj
Tailoring optical nonlinearity and gamma-ray shielding in [Formula: see text]-modified borate-BCZT glasses. [PDF]
Gaber EA +3 more
europepmc +1 more source
Three-dimensional dynamic response of infinite plate resting on multilayered orthotropic foundation under moving loads. [PDF]
Zhang CL, Cao M, Hong L, Qi YF.
europepmc +1 more source
Love Wave Propagation in a Piezoelectric Composite Structure with an Inhomogeneous Internal Layer. [PDF]
Zhao Y, Li P, Fan G, Shao C.
europepmc +1 more source
BASIC PROPERTIES OF MAMMOGRAPHY UNIT : MEASUREMENT OF HALF-VALUE LAYER
MASAMITSU MORIYA +2 more
openaire +2 more sources
Determination of the half-value layer (HVL) in mammography: impact of field size [PDF]
XXXIII симпозијум ДЗЗСЦГ [Друштва за заштиту од зрачења Србије и Црне Горе] : 1-3. октобар 2025. године.
Kojić, Andrea +5 more
openaire
TiO<sub>2</sub> nanolayer-assisted top-interface engineering for disturbance-free FeFETs: a blueprint for future van der Waals memory. [PDF]
Kang H +11 more
europepmc +1 more source
Distinct distributions of myosin motor conformations during contraction of slow and fast skeletal muscle. [PDF]
Hill C +8 more
europepmc +1 more source

