Results 201 to 210 of about 25,587 (261)

GeoRescue: A Geometric LiDAR Point Cloud Registration Framework for Resource-Constrained Edge Platforms. [PDF]

Sensors (Basel)
Sun Y, Shang Z, Yang M, Meng F, Mu M, Yan H.   +5 more
europepmc   +1 more source

A Printed Hydrogel Hybrid Electronic System With Thermoresponsive Adhesion for Neurophysiological Monitoring

Advanced Science, EarlyView.
This work develops a soft hybrid electronic system with printed thermoresponsive hydrogel electrodes, which enables high‐fidelity neural signal acquisition and stimulation. The system precisely assesses median and ulnar nerve injuries in clinical cases, realizing accurate diagnosis of neural impairment while ensuring customized adhesion regulation ...
Bo Pang, Ganguang Yang, Jiacheng Wen, Hangyu Gong, Caixin Gong, Yuqi Qiu, Zhixin Wang, Qingyang Zheng, Sen Zhou, Tianzhao Bu, Jia Tian, Zhouping Yin, Yutian Liu, Hao Wu   +13 more
wiley   +1 more source

Characterization and Optimization of Intelligent Dampers Based on Bionic Principles. [PDF]

Biomimetics (Basel)
Guo N, Zhang Y, Cheng H, Zhao W, Gao Y, Li W, Li Y.   +6 more
europepmc   +1 more source

Anomaly-based data reduction for energy-efficient edge computing in IoT with LoRa. [PDF]

Sci Rep
Karadas F, Usanmaz B.
europepmc   +1 more source

Zynq-Based Hardware-Software Codesign Architecture for an Intelligent Hyperspectral Camera. [PDF]

Sensors (Basel)
Xie L, Zhang L, Yang F, Lin M, Wang J, Cao S, Zhang C, Liu D, Pan M, Yang J.   +9 more
europepmc   +1 more source

Large magnetic resonance imaging-based medial posterior tibial slope is associated with time-dependent worsening of rotational knee laxity after anterior cruciate ligament reconstruction. [PDF]

J Exp Orthop
Abe K, Fukushima H, Hanaki S, Ota K, Kobayashi M, Kawanishi Y, Kato J, Demura S, Murakami H, Nozaki M.   +9 more
europepmc   +1 more source

Vibration error correction in absolute gravity measurement using BP neural network. [PDF]

Sci Rep
Niu Y, Wu Q, Zhang Y, Li Z.
europepmc   +1 more source

A Physics-Consistent Framework for Semiconductor Device Reliability Including Multiple Degradation Mechanisms. [PDF]

Micromachines (Basel)
Bernstein JB, Avraham T, Wang B.
europepmc   +1 more source