Results 31 to 40 of about 4,288,982 (141)

Can hydrogenation mitigate Cu-induced bulk degradation in silicon? [PDF]

open access: yes, 2020
Many defects can cause significant bulk degradation in crystalline silicon, which inherently limits solar cell efficiency. Perhaps the most well-known source of light-induced bulk degradation (LID) in Czochralski-grown silicon is the boron-oxygen defect.
Heikkinen, Ismo T.S.   +15 more
core   +1 more source

Effect of temperature and pre-annealing on the potential-induced degradation of silicon heterojunction photovoltaic modules [PDF]

open access: yes, 2022
We investigate the effect of temperature and pre-annealing on the potential-induced degradation (PID) of silicon heterojunction (SHJ) photovoltaic (PV) modules.
Masuda, Atsushi   +3 more
core   +1 more source

Proteasome nuclear activity affects chromosome stability by controlling the turnover of Mms22, a protein important for DNA repair. [PDF]

open access: yesPLoS Genetics, 2010
To expand the known spectrum of genes that maintain genome stability, we screened a recently released collection of temperature sensitive (Ts) yeast mutants for a chromosome instability (CIN) phenotype.
Shay Ben-Aroya   +6 more
doaj   +1 more source

Investigation on the dependence of degradation rate on hole concentration during boron-oxygen related light-induced degradation in crystalline silicon

open access: yesAIP Advances, 2018
Boron-oxygen related light-induced degradation (BO-LID) of effective charge carrier lifetime is one of the major problems for photovoltaics based on oxygen-rich boron-doped wafer substrates.
Alexander Graf, Axel Herguth, Giso Hahn
doaj   +1 more source

Amplitude response and singularity behavior of circadian clock to external stimuli

open access: yesnpj Systems Biology and Applications, 2023
Amplitude changes caused by environmental cues are universal in the circadian clock and associated with various diseases. Singularity behavior, characterized by the disruption of circadian rhythms due to critical stimuli, has been observed across various
Tao Zhang, Yu Liu, Ling Yang
doaj   +1 more source

Study on the Electrical Injection Regeneration of Industrialized B-Doped Czochralski Silicon PERC Solar Cells

open access: yesInternational Journal of Photoenergy, 2019
In this paper, 156 mm×156 mm boron-doped Czochralski silicon (Cz-Si) wafers were fabricated into PERC solar cells by using the industrial standard process; then, the as-prepared PERC solar cells were treated by the regeneration process using electrical ...
Jiaxing Ye   +5 more
doaj   +1 more source

Second-stage potential-induced degradation of n-type front-emitter crystalline silicon photovoltaic modules and its recovery [PDF]

open access: yes, 2023
We investigate the second-stage potential-induced degradation (PID) of n-type front-emitter (n-FE) crystalline silicon (c-Si) photovoltaic (PV) modules. The PID of n-FE c-Si PV modules is known to occur in three stages under negative bias stress.
Masuda, Atsushi   +7 more
core   +1 more source

LEDs for the Implementation of Advanced Hydrogenation Using Hydrogen Charge-State Control

open access: yesInternational Journal of Photoenergy, 2018
Light-induced degradation (LID) of p-type Cz solar cells has plagued the industry for many decades. However, in recent years, new techniques for solving this LID have been developed, with hydrogen passivation of the boron-oxygen defects appearing to be ...
Chee Mun Chong   +6 more
doaj   +1 more source

Influence of N-type μc-SiOx:H intermediate reflector and top cell material properties on the electrical performance of “micromorph” tandem solar cells

open access: yesAIP Advances, 2018
Amorphous silicon (a-Si:H) / micro-crystalline silicon (μc-Si:H), "micromorph" tandem solar cells have been investigated using a detailed electrical - optical model. Although such a tandem has good light absorption over the entire visible spectrum, the a-
P. Chatterjee, P. Roca i Cabarrocas
doaj   +1 more source

Multistage performance deterioration in n-type crystalline silicon photovoltaic modules undergoing potential-induced degradation [PDF]

open access: yes, 2018
This study addresses the behavior of n-type front-emitter (FE) crystalline-silicon (c-Si) photovoltaic (PV) modules in potential-induced degradation (PID) tests with a long duration of up to 20 days.
Masuda, Atsushi   +7 more
core   +1 more source

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