ACS Nano, 2016 Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials of materials at the nanoscale, has extensive applications in characterizing the electric and electronic properties of metal, semiconductor, and insulator ...
Shengming Li +4 more
semanticscholar +1 more source
COMPENSATION OF MEASUREMENT ERRORS WHEN REDUCING LINEAR DIMENSIONS OF THE KELVIN PROBE
Приборы и методы измерений, 2015 The study is based on results of modeling of measurement circuit containing vibrating-plate capacitor using a complex-harmonic analysis technique. Low value of normalized frequency of small-sized scanning Kelvin probe leads to high distortion factor of ...
A. K. Tyavlovsky, A. L. Zharin
doaj
Pulsed Force Kelvin Probe Force Microscopy through Integration of Lock-In Detection. [PDF]
Nano Lett, 2023 Zahmatkeshsaredorahi A +4 more
europepmc +1 more source
Impact of Intermittent Deposition on Spontaneous Orientation Polarization of Organic Amorphous Films Revealed by Rotary Kelvin Probe. [PDF]
ACS Appl Mater Interfaces, 2023 Ohara M +4 more
europepmc +1 more source
Unraveling Spatiotemporal Transient Dynamics at the Nanoscale via Wavelet Transform-Based Kelvin Probe Force Microscopy. [PDF]
ACS Nano, 2023 Biglarbeigi P +9 more
europepmc +1 more source
KELVIN PROBE’S STRAY CAPACITANCE AND NOISE SIMULATION
Приборы и методы измерений, 2014 Stray capacitance effects and their influence on Kelvin probe’s performance are studied using mathematical and computer simulation. Presence of metal surface, even grounded, in vicinity of vibrating Kelvin probe produces the additional stray signal of complex harmonic character.
Danyluk, S. +7 more
openaire +2 more sources
Cross-sectional Kelvin probe force microscopy on III-V epitaxial multilayer stacks: challenges and perspectives. [PDF]
Beilstein J Nanotechnol, 2023 da Lisca M +6 more
europepmc +1 more source
Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination. [PDF]
Beilstein J Nanotechnol, 2023 Eftekhari Z +8 more
europepmc +1 more source
Ag Nanocluster Production through DC Magnetron Sputtering and Inert Gas Condensation: A Study of Structural, Kelvin Probe Force Microscopy, and Optical Properties. [PDF]
Nanomaterials (Basel), 2023 Musa I, Qamhieh N, Mahmoud ST.
europepmc +1 more source
Kelvin Probe Microscopy Investigation of Poly-Octylthiophene Aggregates. [PDF]
Materials (Basel), 2022 Bermejo J, Colchero J, Palacios-Lidon E.
europepmc +1 more source