Results 111 to 120 of about 2,111,321 (211)

Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy. [PDF]

Beilstein J Nanotechnol, 2022
Ishida N.
europepmc   +1 more source

Analysis of Kelvin Probe Operational Models

, 2011
22 pages, 16 ...
openaire   +2 more sources

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water. [PDF]

Beilstein J Nanotechnol, 2022
Kilpatrick JI, Kargin E, Rodriguez BJ.
europepmc   +1 more source

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode. [PDF]

Beilstein J Nanotechnol, 2021
Stan G, Namboodiri P.
europepmc   +1 more source

Local Surface Potential Modification of Few‐Layer MoS2 Via Optical Soldering Induced n‐Doping Process

Advanced Materials Interfaces
Local surface potential modification by defect structures in 2D transition metal dichalcogenide (2D‐TMDC) is of particular interest for engineering of their optoelectronic and surface chemical properties.
Daeho Kim, Hanwoong Choi, Dong Hyun Seo, Taewan Kim, ChaeHo Shin, Hyunwoo Kim   +5 more
doaj   +1 more source

Measurement of polarization effects in dual-phase ceria-based oxygen permeation membranes using Kelvin probe force microscopy. [PDF]

Beilstein J Nanotechnol, 2021
Neuhaus K, Schmidt C, Fischer L, Meulenberg WA, Ran K, Mayer J, Baumann S.   +6 more
europepmc   +1 more source

Photoelectrochemical Behavior of Heterostructure Based on Doping Effect: BiVO4/BiV1−xTixO4 System

ChemElectroChem
In this study, a set of Ti‐doped BiVO4 photoelectrodes with Ti content varying in the range from 0 to 10 at% is synthesized. All synthesized samples are characterized by XRD, Raman spectroscopy, XPS, UPS, and Kelvin probe methods confirming the formation
Anna A. Murashkina, Tair V. Bakiev, Aida V. Rudakova, Alexei V. Emeline, Detlef W. Bahnemann   +4 more
doaj   +1 more source

Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors. [PDF]

Nanoscale Adv, 2022
Brouillard M, Bercu N, Zschieschang U, Simonetti O, Mittapalli R, Klauk H, Giraudet L.   +6 more
europepmc   +1 more source

Kelvin probe force microscopy for perovskite solar cells

Science China Materials, 2019
Z. Kang, Haonan Si, Mingyue Shi, Chenzhe Xu, Wenqiang Fan, S. Ma, Ammarah Kausar, Qingliang Liao, Zheng Zhang, Yue Zhang   +9 more
semanticscholar   +1 more source

Kelvin probe force microscopy on patterned large-area biofunctionalized surfaces: a reliable ultrasensitive platform for biomarker detection.

J Mater Chem C Mater, 2023
Di Franco C, Piscitelli M, Macchia E, Scandurra C, Catacchio M, Torsi L, Scamarcio G.   +6 more
europepmc   +1 more source