Results 151 to 160 of about 2,111,321 (211)

Pulsed Force Kelvin Probe Force Microscopy

ACS Nano, 2020
Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures and surface residual charges. Kelvin probe force microscopy (KPFM), an imaging technique of atomic force microscopy, has been widely used for surface potential and work function mapping at the nanoscale.
Devon S. Jakob, Haomin Wang, Xiaoji G. Xu   +2 more
semanticscholar   +5 more sources

Real-space imaging of anisotropic charge of σ-hole by means of Kelvin probe force microscopy

Science, 2021
Description Resolution of the σ-hole Anisotropic distribution of charges on atoms plays an important role in intermolecular interactions, yet direct experimental imaging remains a long-standing challenge.
B. Mallada, A. Gallardo, M. Lamanec, B. de la Torre, V. Špirko, P. Hobza, P. Jelínek   +6 more
semanticscholar   +3 more sources

High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)

Electrochimica Acta, 2007
With the introduction of a Kelvin probe mode to atomic force microscopy, the so called scanning Kelvin probe force microscopy (SKPFM), the Kelvin probe technique finds application in a steadily increasing number of different fields, from corrosion science to microelectronics and biosciences.
Rohwerder, M., Turcu, E.
exaly   +5 more sources

Kelvin Probe Force Microscopy Reveals Spatially Resolved Charge-Transfer Mechanism in CdS/BiOBr S-scheme Heterojunction Photocatalyst.

Angewandte Chemie - International Edition
S-scheme heterojunctions hold great promise for photocatalysis, yet a comprehensive understanding of their charge-transfer mechanisms remains limited.
Zheng Meng, Jianjun Zhang, Haoyu Long, Hermenegildo García, Liuyang Zhang, Bicheng Zhu, Jiaguo Yu   +6 more
semanticscholar   +3 more sources

Kelvin probe force microscopy and its application

Surface Science Reports, 2011
W. Melitz, Jian Shen, A. Kummel, Sangyeob Lee   +3 more
semanticscholar   +3 more sources

Kelvin Probe Force Microscopy

2018
Sadewasser, Sascha, Glatzel, Thilo
openaire   +3 more sources

Three-Dimensional Kelvin Probe Force Microscopy

ACS Applied Materials & Interfaces, 2022
Traditional Kelvin probe force microscopy (KPFM) is mainly limited to the characterization of two-dimensional (2D) surfaces, and in situ surface potential (SP) imaging along 3D device surfaces remains a challenge. This paper presents a multimode 3D-KPFM based on an orthogonal cantilever probe (OCP) that can achieve SP mapping of 3D micronano structures.
Junyuan Geng, Hao Zhang, Xianghe Meng, Haibo Gao, Weibin Rong, Hui Xie   +5 more
openaire   +2 more sources

Quantitative calibration of the relationship between Volta potential measured by scanning Kelvin probe force microscope (SKPFM) and hydrogen concentration

, 2021
The quantitative relationship between the Volta potential measured by scanning Kelvin probe force microscope (SKPFM) and hydrogen concentration values on the pure nickel surface has been calibrated.
Zhaoxiang Ma, X. Xiong, Lin Chen, Yanjing Su   +3 more
semanticscholar   +1 more source

Hydrogen effect on the passivation and crevice corrosion initiation of AISI 304L using Scanning Kelvin Probe

, 2021
Scanning Kelvin Probe was applied to study passivation of AISI 304 L stainless steel after cathodic polarisation. The rate of passivation in air decreased as a function of duration and current density.
V. Helbert, A. Nazarov, F. Vucko, S. Rioual, D. Thierry   +4 more
semanticscholar   +1 more source

Stepped horn actuated Kelvin probe

Review of Scientific Instruments, 2008
We have developed an original Kelvin probe system using an ultrasonic stepped horn sonotrode. This actuator is optimized in order to maximize the velocity of the tip end, and hence to increase the Kelvin current detected. Such development is essential to improve surface potential measurements at small spatial scale.
Reboul, J.R., Guasch, C., Ferrandis, J.-Y., Bonnet, J.   +3 more
openaire   +2 more sources