Results 161 to 170 of about 2,111,321 (211)

Quantitative Kelvin Probe Force Microscopy

MRS Proceedings, 2009
AbstractIn this paper we report on the investigation of electrostatic forces between a conductive probe and semiconducting materials by means of Kelvin probe force microscopy measurements. Due to the formation of an asymmetric electric dipole at the semiconductor surface, the measured KPFM bias is related with the energy difference between Fermi energy
Baumgart, C., Helm, M., Schmidt, H.
openaire   +2 more sources

Corrosion behavior characterization of as extruded Mg-8Li-3Al alloy with minor alloying elements (Gd, Sn and Cu) by scanning Kelvin probe force microscopy

, 2020
The effects of Gd, Sn and Cu on the corrosion behavior of as extruded Mg–8Li–3Al (LA83) alloy were characterized by scanning Kelvin probe force microscopy, weight loss, hydrogen evolution, and electrochemical measurements. Result revealed that many Al2Gd,
Zhi Hu, Zheng Yin, Z. Yin, Kun Wang, Qidong Liu, Pengfei Sun, Hong Yan, Honggun Song, Chao Luo, H. Guan, Chassagne Luc   +10 more
semanticscholar   +1 more source

Kelvin probe force microscopy

Applied Physics Letters, 1991
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact ...
M. Nonnenmacher, M. P. O’Boyle, H. K. Wickramasinghe   +2 more
openaire   +1 more source

The finding of hydrogen trapping at phase boundary in austenitic stainless steel by scanning Kelvin probe force microscopy

Scripta Materialia, 2019
Scanning Kelvin probe force microscopy (SKPFM) in nitrogen atmosphere, which can detect the variation of surface contact potential difference (CPD) caused by hydrogen ingress, was used to investigate hydrogen distribution in thermally hydrogen-precharged
Zhengli Hua, Shengyi Zhu, B. An, T. Iijima, C. Gu, Jinyang Zheng   +5 more
semanticscholar   +1 more source

Investigating 2D WS2 supercapacitor electrode performance by Kelvin probe force microscopy

Journal of Materials Chemistry A, 2020
Uncovering the mechanism behind the increase in capacitance of a 2D WS2 supercapacitor electrode upon cycling using KPFM analysis.
K. Sambath Kumar, Nitin Choudhary, Deepak Pandey, Yi Ding, Luis Hurtado, Hee-Suk Chung, L. Tetard, Yeonwoong Jung, Jayan Thomas   +8 more
semanticscholar   +1 more source

Pitfalls in Kelvin probe measurements

Journal of Applied Physics, 2009
We report on the interpretation of thickness-dependent surface potential profiles in insulators on metal substrates measured by Kelvin probe method. The electrical potentials are calculated within a self-consistent model taking both the conductive substrate and the insulator into account.
Oliver M. Ottinger, Christian Melzer, Heinz von Seggern   +2 more
openaire   +1 more source

Multitip scanning bio-Kelvin probe

Review of Scientific Instruments, 1999
We have developed a novel multitip scanning Kelvin probe which can measure changes in biological surface potential ΔVs to within 2 mV and, quasisimultaneously monitor displacement to <1 μm. The control and measurement subcomponents are PC based and incorporate a flexible user interface permitting software control of each individual tip ...
Baikie, I.D., Smith, P.J.S., Porterfield, D.M., Estrup, P.J.   +3 more
openaire   +2 more sources

Kelvin Probe Force Microscopy in Nonpolar Liquids

Langmuir, 2012
Work function changes of Au were measured by Kelvin probe force microscopy (KPFM) in the nonpolar liquid decane. As a proof of principle for the measurement in liquids, we investigated the work function change of an Au substrate upon hexadecanethiol chemisorption.
Domanski, A., Sengupta, E., Bley, K., Untch, M., Weber, S., Landfester, K., Weiss, C., Butt, H., Berger, R.   +8 more
openaire   +3 more sources

������������ �������������������� ������������������ �������������������� ���� ���� ���������� ������ ���������������� Kelvin Probe Force Microscopy

2009
The current essay deals with the Kelvin probe Force Microscopy (KPFM) technique. In the first chapter, the basic theoretical background is set together with some practical aspects that are crucial for the proper implementation of the experiments. In chapter 2, we focus on the most relevant parameters for the technique in order to figure out the manner ...
openaire   +1 more source

Signal reversal in Kelvin-probe force microscopy

Review of Scientific Instruments, 2019
Kelvin-probe force microscopy is a measurement mode of atomic force microscopy, which is used to quantitatively map the electrical surface potential of a sample. Inadequate hardware and electronic design can lead to signal cross talk and, in consequence, false results.
P. Mesquida, D. Kohl, G. Schitter
openaire   +3 more sources