Results 171 to 180 of about 2,111,321 (211)

Kelvin Probe Force Microscope

2018
KPFM mode as shown in Fig. 51.1 generates images based on the electric potential of the sample surface. Applying an AC voltage to a conductive cantilever and detecting the resulting electric force makes it possible to observe the surface profile and, at the same time, the surface potential distribution.
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A UHV guarded Kelvin probe

Journal of Physics E: Scientific Instruments, 1972
A probe for use in measurements of contact potential differences (CPD) has been designed and constructed. The probe has the following unique features: (i) it is guarded against capacitive coupling between the probe and surfaces other than the sample; (ii) it can be heated so that adsorbed gases can be flashed off; (iii) it is excellent for use in UHV ...
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Kelvin Probe Force Microscope Measurement Uncertainty

Advanced Materials Research, 2011
Kelvin Probe Force Microscopy is an attractive technique for characterizing the surface potential of various samples. The main advantage of this technique is its high spatial resolution together with high sensitivity. However as in any nanoscale measurements also in case of KFM it is extremly difficult to describe the uncertainty of the measurement ...
Maciej Ligowski, Michiharu Tabe, Ryszard Jabłoński   +2 more
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Kelvin Probe Force Microscopy Imaging Using Carbon Nanotube Probe

Japanese Journal of Applied Physics, 2001
We have measured the potential profiles of the contact potential difference (CPD) between Al-evaporated substrates and dispersed carbon nanotubes (CNTs) by Kelvin probe force microscopy (KFM) using both a conventional Au-coated Si (Au–Si) probe and a CNT probe.
Satoru Takahashi, Takayoshi Kishida, Seiji Akita Seiji Akita, Yoshikazu Nakayama Yoshikazu Nakayama   +3 more
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Preventing probe induced topography correlated artifacts in Kelvin Probe Force Microscopy

Ultramicroscopy, 2016
Kelvin Probe Force Microscopy (KPFM) on samples with rough surface topography can be hindered by topography correlated artifacts. We show that, with the proper experimental configuration and using homogeneously metal coated probes, we are able to obtain amplitude modulation (AM) KPFM results on a gold coated sample with rough topography that are free ...
Polak, L., Wijngaarden, Rinke J.
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Kelvin Probe Force Microscopy of Semiconductors

2007
Due to their technological importance, III–V compound semiconductors have been widely studied. While extensive work has been done on their geometric and electronic structure, Kelvin probe force microscopy (KPFM) in ultrahigh vacuum (UHV) creates the possibility to study the electronic structure of the surfaces on a nanometer scale [1].
Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, M. Ch. Lux-Steiner   +5 more
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Principles of Kelvin Probe Force Microscopy

2007
In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high ...
Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks   +4 more
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Kelvin Probe Force Microscopy

2012
Bharat Bhushan, Manuel L. B. Palacio
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Kelvin probe liquid-surface potential sensor

Review of Scientific Instruments, 1999
The design of a surface potential sensor is described in detail. It uses the Kelvin vibrating-probe principle and is specifically designed to characterize organic overlayers on poorly conducting liquid substrates. A novel manual compensation control allows the systematic measurement offsets originating in the electronics to be nulled. The head is based
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New Feedback Kelvin Probe

Review of Scientific Instruments, 1968
Y. Petit-Clerc, J. D. Carette
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