Results 71 to 80 of about 2,111,321 (211)
KELVIN PROBE SELF-CALIBRATION MODE FOR SEMICONDUCTOR WAFERS PROPERTIES MONITORING
Приборы и методы измерений, 2015 Improvement of repeatability and reliability of semiconductor wafers properties monitoring with a probe charge-sensitive methods is achieved by realization of Kelvin probe self-calibration mode using a wafer’s surface itself as a reference sample ...
R. I. Vorobey +6 more
doaj
Suitability of Various Materials for Probes in Scanning Kelvin Probe Measurements [PDF]
physica status solidi (a), 2017 Volta potential of a material can be easily determined by using scanning Kelvin probe (SKP), but up to now there is no standard method established. This study focuses on finding an alternative or even a standard material for SKP probes. Re, Ni, and Mo are analyzed regarding their suitability for serving as tips in SKP measurements.
Silvia Huber +2 more
openaire +2 more sources
Conduction of topologically-protected charged ferroelectric domain walls
, 2011 We report on the observation of nanoscale conduction at ferroelectric domain walls in hexagonal HoMnO3 protected by the topology of multiferroic vortices using in situ conductive atomic force microscopy, piezoresponse force microscopy, and kelvin-probe ...
J. R. Guest +6 more
core +1 more source
Single-Crystal Organic Charge-Transfer Interfaces probed using Schottky-Gated Heterostructures
, 2012 Organic semiconductors based on small conjugated molecules generally behave as insulators when undoped, but the hetero-interfaces of two such materials can show electrical conductivity as large as in a metal.
. +7 more
core +2 more sources
ARMScope – the versatile platform for scanning probe microscopy systems
Metrology and Measurement Systems, 2020 Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator.
Świadkowski Bartosz +8 more
doaj +1 more source
Dissipation Modulated Kelvin Probe Force Microscopy Method
, 2018 We review a new implementation of Kelvin probe force microscopy (KPFM) in which the dissipation signal of frequency modulation atomic force microscopy (FM-AFM) is used for dc bias voltage feedback (D-KPFM). The dissipation arises from an oscillating electrostatic force that is coherent with the tip oscillation, which is caused by applying the ac ...
Miyahara, Yoichi, Grutter, Peter
openaire +2 more sources
The role of the cantilever in Kelvin probe force microscopy measurements
Beilstein Journal of Nanotechnology, 2011 The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias +5 more
doaj +1 more source
Exploring the Electrical Properties of Twisted Bilayer Graphene [PDF]
, 2019 Two-dimensional materials exhibit properties unlike anything else seen in conventional substances. Electrons in these materials are confined to move only in the plane.
Greenlee, Byron D. +4 more
core +1 more source
DESIGN OF THE CONTACT POTENTIALS DIFFERENCE PROBES
Приборы и методы измерений, 2016 The contact potential difference probes distinguished by great variety and produced mostly in the laboratory for specific experimental applications. As a rule, they consist of commercially available instrumentation, and have a number of disadvantages ...
K. U. Pantsialeyeu +2 more
doaj +1 more source
, 2017 Local domain structures of ferroelectrics have been studied extensively using various modes of scanning probes at the nanoscale, including piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM), though none of these techniques ...
Esfahani, Ehsan Nasr +2 more
core +2 more sources