Results 81 to 90 of about 2,111,321 (211)
Nanoscale, 2017 Solid-state-lithium ion batteries (SS-LIBs) are a promising candidate for next-generation energy storage devices. Novel methods for characterizing electrochemical reactions occurring during battery operation at the nanoscale are highly required for ...
H. Masuda +4 more
semanticscholar +1 more source
Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation [PDF]
, 2017 We report a Kelvin probe force microscopy (KPFM) implementation using the dissipation signal of a frequency modulation atomic force microscopy that is capable of detecting the gradient of electrostatic force rather than electrostatic force. It features a
Y. Miyahara, P. Grutter
semanticscholar +1 more source
Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire
Beilstein Journal of Nanotechnology, 2018 As electronic devices are downsized, physical processes at the interface to electrodes may dominate and limit device performance. A crucial step towards device optimization is being able to separate such contact effects from intrinsic device properties ...
Tino Wagner +4 more
doaj +1 more source
ANALYSIS OF SURFACE DEFECTS OF ALUMINUM AND ITS ALLOYS WITH A SCANNING KELVIN PROBE
Приборы и методы измерений, 2017 Currently, the use of probe electrometry in non-destructive testing is constrained by the complexity of measurement results interpretation. An output signal of electrometric probe depends on a number of physical and chemical parameters of surface ...
A. K. Tyavlovsky +6 more
doaj +1 more source
Kelvin Probe Spectroscopy of a Two-Dimensional Electron Gas Below 300 mK
, 2003 A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in an Ga[Al]As heterostructure. At different separations between AFM tip and sample, a dc-voltage
Copeland J. A. +7 more
core +1 more source
Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy
Materials Research Express, 2020 In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma +4 more
doaj +1 more source
Charging of highly resistive granular metal films
, 2017 We have used the Scanning Kelvin probe microscopy technique to monitor the charging process of highly resistive granular thin films. The sample is connected to two leads and is separated by an insulator layer from a gate electrode. When a gate voltage is
Colchero, J. +6 more
core +2 more sources
, 2016 Surface characterizations of an organophosphorus (OP) gas detector based on chemically functionalized silicon nanoribbon field-effect transistor (SiNR-FET) were performed by Kelvin Probe Force Microscopy (KPFM) and ToF-SIMS, and correlated with changes ...
Carella, A. +9 more
core +4 more sources
Charge erasure analysis on the nanoscale using Kelvin probe force microscopy
AIP Advances, 2017 The charge pattern produced by atomic force microscopy on an insulating surface can be detected on the nanoscale using Kelvin probe force microscopy. Recent applications of charge patterns include data storage, nano-xerography, and charge writing.
Shi-quan Lin, Tian-min Shao
doaj +1 more source
Química Nova, 2010 Electrostatic phenomena were discovered long ago but their interpretation according to well-established atomic-molecular theory is still lacking. As a result, electrostatic phenomena are often irreproducible and uncontrolled, causing serious practical ...
Rubia F. Gouveia +5 more
doaj +1 more source