Results 211 to 220 of about 226,432 (265)

Is ‘No’ a Force-Indicator? Yes, Sooner or Later! [PDF]

open access: possibleLogica Universalis, 2017
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Fabien Schang, James Trafford
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Force Calibration in Lateral Force Microscopy

Journal of Colloid and Interface Science, 2000
An analysis of the contact mechanics and the forces of interaction in lateral force microscopy measurements is presented. This analysis allows for a new method of interpretation of the frictional forces, the lateral contact stiffness, and the contact shear strength.
Cain R.G., Biggs S., Page N.W.
openaire   +5 more sources

Lateral force curve for atomic force/lateral force microscope calibration

Applied Physics Letters, 1995
In this letter, a method to calibrate sensitivity for the three-dimensional displacement of X, Y, and Z directions by using the novel force curve, namely lateral force curve, as well as vertical force curve in atomic force/lateral force microscope (AFM/LFM) measurement is described.
Satoru Fujisawa   +3 more
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Normal and lateral forces in scanning force microscopy

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1994
With an atomic force/friction force microscope operating in the constant force mode and with an optical lever technique as a deflection sensor, we have investigated the total force acting on the cantilever tip during the raster scanning of the sample surface. A model including the normal and lateral components of the force has been worked out.
ASCOLI C   +7 more
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Lateral Capillary Forces

2013
Lateral capillary forces ensuing from perturbed fluid menisci are pivotal to many important technologies, including capillary self-alignment and self-assembly of heterogeneous microsystems. This chapter presents a comprehensive study of the quasi-statics of lateral capillary forces arising from a constrained cylindrical fluid meniscus subjected to ...
Mastrangeli, Massimo, Lambert, Pierre
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Normal and Lateral Forces in Friction Force Microscopy

1995
The comprehension of the behaviour of the force sensors used in Scanning Force and Friction Microscopy, when subjected to both normal and lateral forces, is fundamental for factional coefficient measurements. We have used the finite element analysis to investigate this matter, and the results have been applied within a deconvolution method for the ...
M. Labardi   +4 more
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A new calibration method of the lateral contact stiffness and lateral force using modulated lateral force microscopy

Tribology Letters, 1999
We describe a new calibration method for lateral contact stiffness using modulated lateral force microscopy, a technique that offers some advantages with respect to the more classical friction force microscopy currently used for characterizing the friction properties of materials.
O. Piétrement, J.L. Beaudoin, M. Troyon
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Lateral Walking-Induced Forces on Footbridges

Journal of Bridge Engineering, 2007
In recent years many cases of large amplitude horizontal vibrations of footbridges have been observed, due to dynamic interaction between walkers and the footbridge, which can occur when some conditions on the bridge mass, frequency, and damping, as well as on the crowd density, are met. Such interaction is an intriguing phenomenon, as it is associated
RICCIARDELLI, Francesco d'Assisi   +1 more
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Pedestrian-Induced Lateral Forces on Footbridges

Noise & Vibration Worldwide, 2011
This paper investigates the phenomenon of excessive pedestrian-induced lateral vibrations as observed on several high-profile footbridges. The vibrations are a consequence of human-structure interaction, in which the forces generated by the pedestrians depend strongly on the vibration of the underlying pavement.
E. T. , Ingolfsson   +3 more
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System modelling of a lateral force microscope

Nanotechnology, 2008
To quantitatively analyse lateral force microscope measurements one needs to develop a model able to relate the photodiode signal to the force acting on the tip apex. In this paper we focus on the modelling of the interaction between the cantilever and the optical chain. The laser beam is discretized by a set of rays which propagates in the system. The
Michal, Guillaume, Lu, Cheng, Tieu, A K
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