Results 221 to 230 of about 226,432 (265)

Pulling force in lateral lifting and lowering

Ergonomics, 1998
This work investigated maximal voluntary lateral hand pulling force in 18 healthy, habitually active men. Measurements were made in standing at different static angles of lateral trunk flexion, as well as at different constant lifting and lowering velocities.
Q M, Huang, M, Sato, A, Thorstensson
openaire   +2 more sources

Shape-Independent Lateral Force Calibration

ACS Applied Materials & Interfaces, 2011
Current methods for lateral force calibration are often time-consuming, expensive, or cause significant wear of the tip. A quick and simple alternative is presented in which the linear relationship between force and voltage is exploited. The technique is independent of the shapes of the sample and cantilever and eliminates common problems, while ...
Evan V, Anderson, Saonti, Chakraborty, Taylor, Esformes, Derek, Eggiman, Colin, Degraf, Keeley M, Stevens, Deli, Liu, Nancy A, Burnham   +7 more
openaire   +2 more sources

An Equivalent Lateral Force for Continuous Crushing

Volume 2: Ocean Engineering and Polar and Arctic Sciences and Technology, 2006
This paper addresses a condition where a wide, vertical faced structure is subjected to dynamic actions posed by competent level ice. Loading conditions where the ice fails by continuous crushing are studied. It is widely accepted that the structure reacts reluctantly to very rapidly fluctuating forces.
Kärnä, Tuomo, Qu, Yan, Yue, Qianjin
openaire   +1 more source

Noncontact Method for Calibration of Lateral Forces in Scanning Force Microscopy

Langmuir, 2011
This paper describes a noncontact calibration procedure for lateral force microscopy in air and liquids. The procedure is based on the observation that the sensitivity of a force microscope may be calibrated using the raw thermal noise spectrum of the cantilever and its known spring constant, which can be found from the same uncalibrated thermal noise ...
Kyle, Wagner, Peng, Cheng, Dmitri, Vezenov   +2 more
openaire   +2 more sources

Lateral-force-based haptic display

SIGGRAPH Asia 2015 Haptic Media And Contents Design, 2015
Touching through a screen to a displayed object has been one of a goal of human interface. Several researchers employ vibrations in order to display texture information. However no systems realize to display geometrical shapes and textures. In this research we propose a method of feeling both large bump and precise textures simultaneously through a ...
openaire   +2 more sources

Lateral Force Measurements In A Scanning Force Microscope With Piezoresistive Sensors

Proceedings of the International Solid-State Sensors and Actuators Conference - TRANSDUCERS '95, 2005
We measured the torsion of a small scanning force microscope cantilever beam that is induced by the lateral force acting on its tip during the scanning across a sample surface. The detection is based on the piezoresistive principle. Two resistor loops are suitably arranged on the beam and sense differences in the stress distribution.
Brugger, J., Burger, J., Binggeli, M., Imura, R., de Rooij, N. F.   +4 more
openaire   +2 more sources

Optimization of lateral resolution in magnetic force microscopy

Applied Physics A: Materials Science & Processing, 1998
Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument’s configuration.
Porthun, S., Abelmann, L., Vellekoop, S.J.L., Lodder, J.C., Hug, H.J.   +4 more
openaire   +3 more sources

Microelectromechanical device for lateral force calibration in the atomic force microscope: Lateral electrical nanobalance

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 2005
Calibration of lateral force microscopy cantilevers is essential for the measurement of nanonewton and piconewton frictional forces, which are critical to analytical applications of polymer surfaces, biological structures, and organic molecules at nanoscale lateral resolution.
Cumpson PJ, Hedley J, Clifford CA
openaire   +2 more sources

Lateral Force Microscopy

2018
In lateral force microscopy, not only the topographic image of the sample surface but also the distribution image of the lateral force in the same area can be gotten simultaneously.
openaire   +1 more source

Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

Review of Scientific Instruments, 2008
We present here a method to calibrate the lateral force in the atomic force microscope. This method makes use of an accurately calibrated force sensor composed of a tipless piezoresistive cantilever and corresponding signal amplifying and processing electronics.
Hui, Xie, Julien, Vitard, Sinan, Haliyo, Stéphane, Régnier, Mehdi, Boukallel   +4 more
openaire   +2 more sources