Results 231 to 240 of about 226,432 (265)
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Non-contact lateral force microscopy
Journal of Physics: Condensed Matter, 2017Abstract The goal of atomic force microscopy (AFM) is to measure the short-range forces that act between the tip and the surface. The signal recorded, however, includes long-range forces that are often an unwanted background. Lateral force microscopy (LFM) is a branch of AFM in which a component of force perpendicular to the surface ...
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The influence of lateral forces in scanning force microscopy
Review of Scientific Instruments, 1991A scanning force microscope using interferometric detection of the cantilever deflection is described. The interferometer uses a multimode laser diode with a short coherence length. Despite the poor coherence of the laser, shot-noise-limited detection of displacements is possible, provided that the path difference between the interfering beams is ...
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The Forced Lateral Oscillations of Trailers
Journal of Applied Mechanics, 1957Abstract This paper gives the mechanical response of a simplified model of a trailer when its tow point moves along a certain prescribed path. The type of path considered here is described by a constant forward velocity on which is superimposed a low-velocity-amplitude, sidewise, periodic motion.
A. Slibar, P. R. Paslay
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Lateral Force Estimator Stabilisation
IFAC Proceedings Volumes, 1992Abstract This paper reports the results of the first phase of a continuing project into the stabilization to the lateral accelerations parallel to the deck of a naval ship using the existing active fin stabilization system. It is reported here that the lateral force estimator (LFE) stabilisation scheme gives encouraging performance when judged on ...
A. Tang, P.A. Wilson
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Earthquake forces for the lateral force code
The Structural Design of Tall Buildings, 2000openaire +2 more sources
Lateral Capillary Forces (Dynamics)
2013This chapter presents a study on the dynamics of lateral motion of a liquid meniscus confined by a circular pad and a circular chip moving parallely to the pad. This problem is a typical flip-chip case study, whose use is wide-spread in industrial assembly.
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Calibration procedures for frictional measurements with a lateral force microscope
Wear, 1996Bart Blanpain, Erjia Liu, J P Celis
exaly