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An exploration of leakage current
40th Conference Proceedings on Electronic Components and Technology, 2002A simple programmable sequence of measurements which allows classification of leakage currents of capacitors based on their time, temperature, and voltage characteristics has been devised. The method adopts the concept that the measured current is the sum of independent flow mechanisms, one of which is present to a consistent extent in all the ...
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Statistical leakage analysis using the deterministic modeling of cell leakage current
2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012), 2012This paper presents a new approach to estimate the n-sigma chip leakage current in the chip leakage probability density function of statistical leakage analysis (SLA) through gate-level deterministic leakage analysis (DLA). Although SLA provides accurate result than corner-based analysis, it is an impractical solution in recent technology comprising ...
Jae Hoon Kim, Young Hwan Kim
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1965
The current in the blocking direction in a diode is called the leakage current. There are no leakage currents in the transistor with its two diodes if one electrode is open at a time. The amounts of these leakage currents depend only a little upon the value of the voltage applied (saturation).
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The current in the blocking direction in a diode is called the leakage current. There are no leakage currents in the transistor with its two diodes if one electrode is open at a time. The amounts of these leakage currents depend only a little upon the value of the voltage applied (saturation).
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Leakage current characteristics of XLPE
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981, 1981Because the leakage current in XLPE changes in proportion to the quantity of the crosslinking agent by-products, leakage current might be controlled by the amount of ion conduction carriers which are supplied with the by-products. And because the leakage current in impregnated PE sheets changes in proportion to the conductivity of each by-product in ...
T. Hayami, S. Yarnanouchi, K. Yatsuka
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Leakage currents in SOI MOSFETs
IEEE Transactions on Nuclear Science, 1988Total-dose response of both NMOS and PMOS FETs fabricated on SOI substrates was studied. Two types of back-channel leakage currents were identified. A back-channel leakage due to MOSFET action uses the substrate bias as the gate bias. The other component is due to soft reverse characteristics of the body-drain junction.
N.K. Annamalai, M.C. Biwer
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Statistical Leakage Estimation Based on Sequential Addition of Cell Leakage Currents
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2010This paper presents a novel method for full-chip statistical leakage estimation that considers the impact of process variation. The proposed method considers the correlations among leakage currents in a chip and the state dependence of the leakage current of a cell for an accurate analysis.
Wook Kim, Kyung Tae Do, Kim, YH
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Leakage Current from Appliances
IEEE Transactions on Industry Applications, 1973Leakage current from portable appliances has been limited to 0.5 mA American National Standards Institute (ANSI), Committee C101.1. Typical leakage currents are presented, and the effects of temperature, humidity, grounding, bonding, and circuit conditions on the measured values are discussed.
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Computing Leakage Current Distributions
2009With leakage power increasing as a fraction of the total power of a design, due to the current design trends, it is arguably important to find the leakage for all input vectors. This is useful when comparing candidate implementations of a design with the same minimum leakage values.
Nikhil Jayakumar +4 more
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Determination of leakage currents in medical equipment
The American Journal of Cardiology, 1966C F, Starmer, R E, Whalen, H D, McIntosh
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