Results 11 to 20 of about 315 (122)
Influence of dielectric layers and thermal load on LeTID [PDF]
AIP Conference Proceedings, 2018 Light and elevated temperature induced degradation (LeTID) is observed for multicrystalline (mc) Si passivated emitter and rear cell (PERC) solar cells, strongly limiting solar cell parameters under operation conditions. In this contribution, we investigate the effect of surface passivation layer being present during the firing step based on lifetime ...
Winter, Clemens +3 more
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Identification of the LeTID defect formation as a hydrogen-related dissociation process
AIP Conference Proceedings, 2022 We investigate possible correlations between the temporal evolution of Light and elevated Temperature Induced Degradation (LeTID) and of boron-hydrogen pairs.
Hammann, Benjamin +4 more
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Investigation of LeTID where we can control it – Application of FZ silicon for defect studies [PDF]
AIP Conference Proceedings, 2019 In this work we present results of a series of experiments to investigate the origin of the defects causing light and elevated temperature induced degradation (LeTID). It has been demonstrated that LeTID effects can be observed even in high purity monocrystalline silicon.
Niewelt, Tim +4 more
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Influence of Low-Temperature Annealing before Firing on LeTID in Multicrystalline Silicon
, 2018 35th European Photovoltaic Solar Energy Conference and Exhibition; 342 ...
Schmid, Andreas +5 more
core +4 more sources
LeTID - A Comparison of Test Methods on Module Level
, 2019 Light and elevated Temperature Induced Degradation (LeTID) can lead to significant power losses within the first months or years of PV module operation. Comparably slow degradation rates and the superposition of degradation and regeneration processes challenge the design of time- and cost-efficient but reliable test procedures.
Fokuhl, Esther +5 more
openaire +2 more sources
Low-T anneal as cure for LeTID in Mc-Si PERC cells [PDF]
AIP Conference Proceedings, 2019 Light and elevated temperature induced degradation (LeTID) is known to be affected by the last dark anneal that the silicon wafers or cells experience prior to illumination. Here we study how low-temperature dark anneal performed on fully processed multicrystalline silicon (mc-Si) passivated emitter and rear solar cells (PERC) influences LeTID ...
Pasanen, Toni P. +5 more
openaire +4 more sources
Does LeTID occur in c-Si even without a firing step? [PDF]
AIP Conference Proceedings, 2019 It is shown that a non-fired B-doped floatzone silicon sample coated with SiNx:H may show severe bulk related degradation and regeneration during illuminated treatment at elevated temperature. It is discussed that the likely cause is light and elevated temperature induced degradation (LeTID) in the silicon bulk.
Sperber, David +3 more
openaire +3 more sources
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2017 Temperature- and injection-dependent lifetime spectroscopy (TIDLS) is employed to study the defect responsible for light- and elevated temperature-induced degradation (LeTID). In our previous analyses, titanium (Ti), molybdenum (Mo), and tungsten (W) were identified as potential candidates for LeTID.
Mallory A. Jensen +6 more
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Influence of Emitter Layers on LeTID Kinetics in Multicrystalline Silicon
, 2018 35th European Photovoltaic Solar Energy Conference and Exhibition; 293 ...
Otaegi, Alona +5 more
core +4 more sources
Firing and gettering dependence of effective defect density in material exhibiting LeTID [PDF]
AIP Conference Proceedings, 2018 The investigation of LeTID effects in mc-Si material requires repeated measurements of the minority charge carrier lifetime τeff. Due to the inhomogeneous nature of mc-Si, measurements of τeff should be carried out in a spatially resolved way. In this work, we show results for the impact of firing and gettering on LeTID in high quality mc-Si material ...
Skorka, Daniel +2 more
openaire +3 more sources