Results 141 to 150 of about 7,549 (186)

Design of Covert Communication Waveform Based on Phase Randomization. [PDF]

Entropy (Basel)
Zhou W, Wang Z, Shi J, Guo Q.
europepmc   +1 more source

Length-Weight Distribution of Non-Zero Elements in Randomized Bit Sequences. [PDF]

Sensors (Basel)
Lange C, Ahrens A, Krishnakumar YK, Grote O.   +3 more
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Rosace: a robust deep mutational scanning analysis framework employing position and mean-variance shrinkage. [PDF]

Genome Biol
Rao J, Xin R, Macdonald C, Howard MK, Estevam GO, Yee SW, Wang M, Fraser JS, Coyote-Maestas W, Pimentel H.   +9 more
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Quantum Stream Cipher Based on Holevo-Yuen Theory: Part II. [PDF]

Entropy (Basel)
Hirota O, Sohma M.
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2D logistic map with unit transfer function and modulus operation based pseudorandom number generation for image encryption. [PDF]

Sci Rep
Ahmad R, Said G, Flah A, Kraiem H, El Bayeh CZ, Khattak YH, Baig F.   +6 more
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Reconfigurable security solution based on hopfield neural network for e-healthcare applications. [PDF]

Sci Rep
Lakshmi C, Nithya C, Thenmozhi K, Sivaraman R, Yasvanthira Sri D, Vinizia B, Subashini R, Meikandan PV, Mahalingam H, Amirtharajan R.   +9 more
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Genome-wide identification and characterization of QTLs for transcriptional noise in human midbrain cells

Hirose N, Mizuno S, Niwa Y, Hara T, Yamamoto H, Koyama E, Ueda J, Tsuboi T, Takata A.   +8 more
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Power characterization of LFSRs

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99), 2003
This paper presents a formal analysis on the power consumption of BIST architectures composed of primitive-polynomial LFSRs connected to a combinational CUT. An exact power characterization of all primitive-polynomial LFSRs has been identified, since interesting invariant properties have been discovered.
M. Brazzarola, FUMMI, Franco
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Controllable LFSR for BIST

Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066], 2002
This paper presents the preliminary results for a novel mixed-mode scheme to generate test patterns for random pattern resistant faults. It is based on a programmable method in contrast to the hardware implementation used so far. It not only guarantees the full test coverage in the combinational stuck-at faults, but also can be extended to the ...
D. Kay, S. Mourad
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