Results 241 to 250 of about 4,206,325 (282)
Some of the next articles are maybe not open access.

Magnetic Force Microscopy of Superparamagnetic Nanoparticles

Small, 2008
AbstractThe use of magnetic force microscopy (MFM) to detect probe–sample interactions from superparamagnetic nanoparticles in vitro in ambient atmospheric conditions is reported here. By using both magnetic and nonmagnetic probes in dynamic lift‐mode imaging and by controlling the direction and magnitude of the external magnetic field applied to the ...
P Chris Hammel, Gunjan Agarwal
exaly   +3 more sources

Magnetic Force Microscopy

2021
This chapter is related to the field of magnetic force microcopy (MFM), where the probing tip is covered with a magnetic layer and the magnetic domain structure of the sample can be characterized with high lateral resolution. In addition, other scanning probe methods mapping the magnetic field at a microscopic scale and techniques providing access to ...
Ernst Meyer   +2 more
openaire   +1 more source

Magnetic force microscopy

Russian Chemical Reviews, 1999
Principles of the operation of the magnetic force microscope are considered. The main areas of application of magnetic force microscopy are characterised. The prospects are shown of using this method for solving problems of materials science, including the most topical problem, viz., the creation of magnetic recording media with ultrahigh recording ...
Igor V Yaminsky, Aleksandr M Tishin
openaire   +1 more source

Magnetic force microscopy

Proceedings, annual meeting, Electron Microscopy Society of America, 1991
The aim of this talk is to give a short introduction to the technique of magnetic force microscopy (MFM), review recent advances in instrumentation and present measurement on various magnetic materials.MFM [1, 2] is a non-destructive method which allows the imaging of magnetic structures with little or no sample preparation on a 50-100 nm scale.
P. Grütter   +3 more
openaire   +1 more source

Magnetic Force Microscopy and Magnetic Nanoparticles: Perspectives and Challenges

2021
Among the various techniques for the characterization of magnetic NPs, magnetic force microscopy (MFM) represent one of the most widespread and versatile methods due to its lateral resolution, sensitivity, imaging capability, the need for a relatively simple and widespread experimental setup, minimal/no specific requirements about sample preparations ...
Passeri, Daniele   +2 more
openaire   +2 more sources

Variable-field magnetic force microscopy

Ultramicroscopy, 2009
A new variable external field magnetic force microscope is introduced here. The most outstanding feature of the system is its capability to perform stable images under a variable external magnetic field that can be applied both in in-plane and out-of-plane directions.
Jaafar, M.   +5 more
openaire   +3 more sources

Recent advances in magnetic force microscopy

Ultramicroscopy, 2003
During the past ten years magnetic force microscopy (MFM) has become probably the most powerful general-purpose method for magnetic imaging. MFM can be applied under various environmental conditions and requires only little sample preparation. Basic research on magnetic materials as well as the mentioned industrial applications create an increasing ...
M R, Koblischka, U, Hartmann
openaire   +2 more sources

Magnetic Force Microscopy

2016
Magnetic force microscopy (MFM) is scanning probe technique which enables the analysis of magnetic properties of the samples at the nanoscale using a microfabricated tip coated with a magnetic layer. In this chapter, we describe MFM and give an overview of its applications, ranging from well established to advanced new applications.
Passeri, Daniele   +3 more
openaire   +2 more sources

Magnetic force microscopy of magnetic materials

Ultramicroscopy, 1992
Abstract In this paper we give a brief summary of the basic principles of MFM. Some typical experimental results are discussed to demonstrate the potential, limitations and future perspectives of this technique.
P. Grütter, D. Rugar, H.J. Mamin
openaire   +1 more source

Optimization of lateral resolution in magnetic force microscopy

Applied Physics A: Materials Science & Processing, 1998
Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument’s configuration.
Porthun, S.   +4 more
openaire   +3 more sources

Home - About - Disclaimer - Privacy