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2018
Magnetic force microscope (MFM) is one of the SPM families which can visualize the leakage magnetic field by detecting the magnetic force between a probe and a sample.
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Magnetic force microscope (MFM) is one of the SPM families which can visualize the leakage magnetic field by detecting the magnetic force between a probe and a sample.
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Magnetic Force Calculations Applied to Magnetic Force Microscopy
2010In IC failure analysis the detection of currents is often used to indicate the presence of a defective device. One method used for this analysis is the Magnetic Force Microscopy (MFM). Employing this technique measurement errors often occur as for instance due to heterogeneous magnetic tip coatings, fabrication/abrasion errors of the MFM tips and ...
Thomas Preisner, Wolfgang Mathis
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Magnetic sensitive force microscopy
Nano Today, 2008High-resolution magnetic imaging down to the atomic scale is of utmost importance to understand magnetism on the nanoscale and below. Here we report on recent advances in force microscopy based techniques from our laboratory, namely magnetic force microscopy and magnetic exchange force microscopy. The former is a well established technique for studying
Alexander Schwarz, Roland Wiesendanger
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Reciprocity in magnetic force microscopy
Applied Physics Letters, 1995A theoretical treatment for contrast formation in the magnetic force microscope is given which relies on calculation of the force acting on the sample, rather than the more usual method which calculates the force acting on the microscope tip. The equivalence of this reciprocal force method is demonstrated by calculating the theoretical image for ...
C. D. Wright, E. W. Hill
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Understanding magnetic force microscopy
Zeitschrift f�r Physik B Condensed Matter, 1990Magnetic force microscopy is a new method for imaging ferromagnetic domains with a high lateral resolution (10 nm). In this paper we give the basic tip parameters that have to be taken into account to achieve a quantitative image interpretation. For the electrochemically otched polycrystalline iron, nickel and cobalt wires, the tip-apex domain is found
C. Sch�nenberger, S. F. Alvarado
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1994
Abstract Chapter 12 describes the principles of operation of magnetic force microscopy, which maps magnetostatic forces across the surface of a sample. Note that the interaction between a tip and a magnetic sample can also be probed using the STM (Allenspach et al. 1987, Allenspach and Bischof 1989, Wiesendanger et al.
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Abstract Chapter 12 describes the principles of operation of magnetic force microscopy, which maps magnetostatic forces across the surface of a sample. Note that the interaction between a tip and a magnetic sample can also be probed using the STM (Allenspach et al. 1987, Allenspach and Bischof 1989, Wiesendanger et al.
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2010
Principle of MFM In magnetic force microscopy (MFM), the magnetic stray field above a very flat specimen, or sample, is detected by placing a small magnetic element, the tip, mounted on a cantilever spring very close to the surface of the sample (Figure 1).
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Principle of MFM In magnetic force microscopy (MFM), the magnetic stray field above a very flat specimen, or sample, is detected by placing a small magnetic element, the tip, mounted on a cantilever spring very close to the surface of the sample (Figure 1).
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Magnetic resonance force microscopy
Reviews of Modern Physics, 1995Recent initial experiments in magnetic resonance force microscopy (MRFM) have detected the magnetic force exerted by electrons and nuclei in microscopic samples. The experiments generate a force signal by modulating the sample magnetization with standard magnetic resonance techniques.
J. A. Sidles +6 more
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Magnetic Force Microscopy (MFM)
1992The success of the scanning tunneling microscope (STM) has stimulated the development of a number of related “scanning probe” microscopes, which are based on mechanically scanning a sharp tip over a sample surface. One of the most successful of these new microscopes is the scanning force microscope, invented by Binnig, Quate and Gerber in 1986 [5.1 ...
P. Grütter, H. J. Mamin, D. Rugar
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Magnetic Exchange Force Microscopy
2009Magnetic exchange force microscopy is a novel noncontact atomic-force microscopy based technique to image the arrangement of magnetic moments at surfaces with atomic resolution using sharp magnetic tips. Recent results obtained with iron coated silicon tips on two magnetically different antiferromagnetic surfaces are reviewed: NiO(001), an insulator ...
A. Schwarz +3 more
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