Results 61 to 70 of about 26,586 (117)

Fourier ptychographic coherence scanning interferometry for 3D morphology of high aspect ratio and composite micro-trenches. [PDF]

Light Sci Appl
Li Y, Yuan Q, Huo X, Wang S, He H, Gao Z.   +5 more
europepmc   +1 more source

Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study-Sample Preparation and Stability Issues. [PDF]

Nanomaterials (Basel)
Chibane L, Delvallée A, Fleurence N, Douri S, Morán-Meza J, Ulysse C, Piquemal F, Feltin N, Flahaut E.   +8 more
europepmc   +1 more source

Surface Inspection and Description in Metrology and Tribology-Vol. 2. [PDF]

Materials (Basel)
Wieczorowski M, Bigerelle M, Brown CA, Pawlus P, Reizer R, Pereira A.   +5 more
europepmc   +1 more source

A Comprehensive Review of Optical Metrology and Perception Technologies. [PDF]

Sensors (Basel)
Shan S, Zhao F, Li Z, Luo L, Li X.
europepmc   +1 more source

Informationally complete distributed metrology without a shared reference frame. [PDF]

Nat Commun
Xu HQ, Li GC, Hong XS, Chen L, Zhang SQ, Liu Y, Chen G, Li CF, Guo GC.   +8 more
europepmc   +1 more source

Magnon squeezing in the quantum regime. [PDF]

Nat Commun
Weng YC, Xu D, Chen Z, Tan LZ, Gu XK, Li J, Yu HF, Zhu SY, Hu X, Nori F, You JQ.   +10 more
europepmc   +1 more source

Quantum enhanced metrology based on flipping trajectory of cold Rydberg gases. [PDF]

Nat Commun
Wang YJ, Zhang J, Zhang ZY, Shao SY, Li Q, Chen HC, Ma Y, Han TY, Wang QF, Nan JD, Yin YM, Zhu DY, Fang QQ, Yu C, Liu X, Guo GC, Liu B, Zhang LH, Ding DS, Shi BS.   +19 more
europepmc   +1 more source

Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology. [PDF]

Nat Commun
Oh J, Son J, Yoon C, Hwang E, Ahn J, Lee J, Lee J, Shin J, Lee D, Lim S, Ahn J, Sohn Y, Hyun S, Lee M, Jo T.   +14 more
europepmc   +1 more source

Two-photon induced coherence without induced emission. [PDF]

Sci Adv
Im DG, Yoo SY, Lee CH, Suh J, Kim YH.
europepmc   +1 more source

Digital Metrology for Nanoindentation: Synthetic Data Generator for Error Identification. [PDF]

Micromachines (Basel)
Maculotti G, Giorio L, Genta G, Galetto M.   +3 more
europepmc   +1 more source