Results 11 to 20 of about 1,862,039 (280)

Scanning ultrafast electron microscopy [PDF]

open access: yes, 2010
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200
Mohammed, Omar F.   +2 more
core   +1 more source

Topological Homogeneity for Electron Microscopy Images [PDF]

open access: yes, 2019
In this paper, the concept of homogeneity is defined, from a topological perspective, in order to analyze how uniform is the material composition in 2D electron microscopy images. Topological multiresolution parameters are taken into account to obtain
A Gonzalo   +18 more
core   +1 more source

4D ultrafast electron diffraction, crystallography, and microscopy [PDF]

open access: yes, 2006
In this review, we highlight the progress made in the development of 4D ultrafast electron diffraction (UED), crystallography (UEC), and microscopy (UEM) with a focus on concepts, methodologies, and prototypical applications.
Zewail, Ahmed H.
core   +1 more source

Advanced method for the accurate measurement of tilt angle in a transmission electron microscopy goniometer

open access: yesJournal of Analytical Science and Technology, 2018
Background In order to improve the reliability of the electron tomography (ET) technique, which reveals three-dimensional information of nanostructured materials from a series of tilted two-dimensional images, it is essential that the mechanical tilt ...
Ji-Hyun Lee   +4 more
doaj   +1 more source

Nano-mineralogy Studies by Advanced Electron Microscopy [PDF]

open access: yes, 2007
Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft.
Ma, Chi, Rossman, George R.
core   +1 more source

ALS-linked FUS R521C disrupts arginine methylation of UBAP2L and stress granule dynamics

open access: yesJournal of Analytical Science and Technology, 2023
Mutations in the fused-in-sarcoma (FUS) gene have been linked to familial amyotrophic lateral sclerosis (fALS). FUS aggregates in the cytosol and associates with stress granules (SGs) in pathological cases, whereas FUS is normally found in the nucleus ...
Mi-Hee Jun, Sang-Hee Lee, Yang Hoon Huh
doaj   +1 more source

SCANNING ELECTRON MICROSCOPY [PDF]

open access: yesJournal of the Royal Microscopical Society, 1964
Abstract Scanning electron microscopy is a method of microscopy that permits resolution better than that of the optical microscope (about 100 A) while examining one surface of a bulk specimen. The technique depends on electronic application to microscopy and has been developed over many years by electronic engineers rather than physicists or ...
openaire   +5 more sources

In-situ growth of low-dimensional perovskite-based insular nanocrystals for highly efficient light emitting diodes

open access: yesLight: Science & Applications, 2023
Regulation of perovskite growth plays a critical role in the development of high-performance optoelectronic devices. However, judicious control of the grain growth for perovskite light emitting diodes is elusive due to its multiple requirements in terms ...
Hao Wang   +19 more
doaj   +1 more source

ultraLM and miniLM: Locator tools for smart tracking of fluorescent cells in correlative light and electron microscopy [version 1; referees: 2 approved, 1 approved with reservations]

open access: yesWellcome Open Research, 2016
In-resin fluorescence (IRF) protocols preserve fluorescent proteins in resin-embedded cells and tissues for correlative light and electron microscopy, aiding interpretation of macromolecular function within the complex cellular landscape.
Elisabeth Brama   +5 more
doaj   +1 more source

Realization of aligned three-dimensional single-crystal chromium nanostructures by thermal evaporation [PDF]

open access: yes, 2010
Aligned three-dimensional single-crystal chromium nanostructures are fabricated onto a silicon substrate by thermal evaporation in a conventional thermal evaporator, where the incident angle of Cr vapor flux with respect to the substrate surface normal ...
Alphonse, Pierre   +3 more
core   +2 more sources

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