Results 11 to 20 of about 362,376 (277)

Synthetic Data in Quantitative Scanning Probe Microscopy

Nanomaterials, 2021
Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts.
David Nečas, Petr Klapetek
doaj   +1 more source

Scanning Probe Microscopy controller with advanced sampling support

HardwareX, 2023
A low-cost Digital Signal Processor (DSP) unit for advanced Scanning Probe Microscopy measurements is presented. It is based on Red Pitaya board and custom built electronic boards with additional high bit depth AD and DA converters.
Miroslav Valtr, Petr Klapetek, Jan Martinek, Ondřej Novotný, Zdeněk Jelínek, Václav Hortvík, David Nečas   +6 more
doaj   +1 more source

Magnetic sensitive scanning probe microscopy [PDF]

, 2012
Magnetically sensitive scanning probe microscopes have been solving scientific and engineering problems over the last two decades. The magnetic dipole fields generated by a spherical magnetic particle with radius a decay with math.
Oral, Ahmet
core   +1 more source

ARMScope – the versatile platform for scanning probe microscopy systems

Metrology and Measurement Systems, 2020
Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator.
Świadkowski Bartosz, Piasecki Tomasz, Rudek Maciej, Świątkowski Michał, Gajewski Krzysztof, Majstrzyk Wojciech, Babij Michał, Dzierka Andrzej, Gotszalk Teodor   +8 more
doaj   +1 more source

Binary-state scanning probe microscopy for parallel imaging

Nature Communications, 2022
High-throughput imaging has generally been challenging for scanning probe microscopy techniques. Here, the authors introduce binary-state scanning probe microscopy, which uses a cantilever-free elastomeric probes and a hierarchical measurement ...
Gwangmook Kim, Eoh Jin Kim, Hyung Wan Do, Min-Kyun Cho, Sungsoon Kim, Shinill Kang, Dohun Kim, Jinwoo Cheon, Wooyoung Shim   +8 more
doaj   +1 more source

Traceably calibrated scanning Hall probe microscopy at room temperature [PDF]

Journal of Sensors and Sensor Systems, 2020
Fabrication, characterization and comparison of gold and graphene micro- and nanoscale Hall sensors for room temperature scanning magnetic field microscopy applications are presented.
M. Gerken, A. Solignac, D. Momeni Pakdehi, A. Manzin, T. Weimann, K. Pierz, S. Sievers, H. W. Schumacher   +7 more
doaj   +1 more source

In situ scanning electrochemical probe microscopy for energy applications [PDF]

, 2012
High resolution electrochemical imaging methods provide opportunities to study localized phenomena on electrode surfaces. Here, we review recent advances in scanning electrochemical microscopy (SECM) to study materials involved in (electrocatalytic ...
Lai, Stanley Chi Shing, Macpherson, Julie V., Unwin, Patrick R.   +2 more
core   +1 more source

Scanning Probe Microscopy Techniques for Studying the Cell Glycocalyx

Cells, 2023
The glycocalyx is a brush-like layer that covers the surfaces of the membranes of most cell types. It consists of a mixture of carbohydrates, mainly glycoproteins and proteoglycans.
Dmitry Kolesov, Anna Astakhova, Maria Galdobina, Alexey Moskovtsev, Aslan Kubatiev, Alisa Sokolovskaya, Leonid Ukrainskiy, Sergey Morozov   +7 more
doaj   +1 more source

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

Beilstein Journal of Nanotechnology, 2022
Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices.
Hao Liu, Zuned Ahmed, Sasa Vranjkovic, Manfred Parschau, Andrada-Oana Mandru, Hans J. Hug   +5 more
doaj   +1 more source

A robust, scanning quantum system for nanoscale sensing and imaging [PDF]

, 2011
Controllable atomic-scale quantum systems hold great potential as sensitive tools for nanoscale imaging and metrology. Possible applications range from nanoscale electric and magnetic field sensing to single photon microscopy, quantum information ...
A Cuche, A Dreau, A Gruber, A. Yacoby, B Naydenov, B. Hausmann, BC Buchler, BE Kane, BJ Hausmann, BM Chernobrod, C Bradac, C Kurtsiefer, C Lee, CL Degen, E Togan, E Van Oort, F Dolde, F Jelezko, F Wolny, G Balasubramanian, G Balasubramanian, G De Lange, J Michaelis, J Taylor, JR Maze, L Childress, LP McGuinness, M. D. Lukin, M. Loncar, M. S. Grinolds, MS Grinolds, N Lai, P Neumann, P Recher, P. Maletinsky, R Kalish, R. L. Walsworth, S Kuhn, S Pezzagna, S Sekatskii, S. Hong, T Kohashi, TM Babinec   +42 more
core   +3 more sources