Results 291 to 300 of about 37,917 (360)

Structure of NiMo alloys

open access: yesMetal Powder Report, 1990
openaire   +1 more source

Author Correction: Wafer-scale high-κ HfO<sub>2</sub> dielectric films with sub-5-Å equivalent oxide thickness for 2D MoS<sub>2</sub> transistors. [PDF]

open access: yesNat Commun
Zhang S   +21 more
europepmc   +1 more source

Ionic current in MOS structures

Annales des Télécommunications, 2004
A new approach of determining dynamic ionic current-voltage characteristic that is due to ion transport phenomenon in the oxide is presented. In this approach, the formulation of I–V characteristics ofmos device can be achieved through the use of the theoretical model of mobile ion distribution in oxides.
Hamid Bentarzi   +2 more
openaire   +1 more source

Home - About - Disclaimer - Privacy