Results 61 to 70 of about 4,233 (222)

Area-Selective Growth of Aligned ZnO Nanorod Arrays for MEMS Device Applications

open access: yesProceedings, 2018
ZnO nanorods (NRs) arrays with good vertical alignment were selectively grown on microscale patterned surfaces by a MEMS-compatible, low-temperature chemical-bath deposition method (CBD).
Jiushuai Xu   +6 more
doaj   +1 more source

Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures

open access: yesFrontiers in Physics, 2022
Conventional spectroscopic ellipsometry is a powerful tool in optical metrology. However, when it comes to the characterization of non-periodic nanostructures or structured fields that are much smaller than the illumination spot size, it is not well ...
Tim Käseberg   +10 more
doaj   +1 more source

Size-selective nanoparticle growth on few-layer graphene films

open access: yes, 2010
We observe that gold atoms deposited by physical vapor deposition onto few layer graphenes condense upon annealing to form nanoparticles with an average diameter that is determined by the graphene film thickness.
Adam S.   +18 more
core   +2 more sources

Machine Learning Approaches in Soft Matter Molecular Simulation and Materials Characterization: Challenges and Perspectives

open access: yesChemPlusChem, Volume 90, Issue 12, December 10, 2025.
Rigorous frameworks construction toward the development of science‐based machine learning (ML) schemes: invocation of statistical learning and data‐driven methods within the diverse materials science fields, from materials characterization to molecular modeling utilizing domain knowledge to facilitate fundamental understanding and scientific discovery.
Niki Vergadou, Vassilios Constantoudis
wiley   +1 more source

Nanometrology and super-resolution imaging with DNA [PDF]

open access: yesMRS Bulletin, 2017
Abstract
Graugnard, Elton   +5 more
openaire   +5 more sources

DC‐Driven Fractional Flux Quanta in Two‐Band Superconductors

open access: yesphysica status solidi (RRL) – Rapid Research Letters, Volume 19, Issue 12, December 2025.
The dc‐driven distancing of fractional flux quanta is theoretically analyzed for a dual‐band superconductor with a periodic pinning potential. The analysis is based on the dynamical equation of motion for a single composite vortex. The model neglects the phase difference between the condensates and may be applicable to two‐band superconductors with ...
Anton O. Pokusinskyi   +1 more
wiley   +1 more source

Comparison measurements for hybrid evaluation approaches in optical nanometrology

open access: yesEPJ Web of Conferences
In the pursuit of closing the gap between nanometrology and nanofabrication, we investigate the use of advanced optical far field methods for sub-wavelength parameter reconstruction.
T. Käseberg   +7 more
semanticscholar   +1 more source

Vortex Ratchet Effect in Superconductor Open Nanotubes and 3D Nanoflakes

open access: yesphysica status solidi (RRL) – Rapid Research Letters, Volume 19, Issue 12, December 2025.
Magnetic flux quanta in 3D superconductor nanotubes move in the regions where the normal component of the applied magnetic field is close to maximum. Asymmetric pinning sites placed in these areas result in an enhanced vortex ratchet effect compared to planar systems.
Igor Bogush   +3 more
wiley   +1 more source

An Improved Data Processing Algorithm for Spectrally Resolved Interferometry Using a Femtosecond Laser

open access: yesSensors
Spectrally resolved interferometry utilizing a femtosecond laser is widely employed for absolute distance measurement. However, deviations in the output time pulse of the conventional algorithm through inverse Fourier transform are inevitable. Herein, an
Tao Liu   +4 more
doaj   +1 more source

High-Precision Cutting Edge Radius Measurement of Single Point Diamond Tools Using an Atomic Force Microscope and a Reverse Cutting Edge Artifact

open access: yesApplied Sciences, 2020
This paper presents a measurement method for high-precision cutting edge radius of single point diamond tools using an atomic force microscope (AFM) and a reverse cutting edge artifact based on the edge reversal method.
Kai Zhang   +4 more
doaj   +1 more source

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