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NON‐CONTACT TONOMETRY BY ASSISTANTS

American journal of optometry and physiological optic, 1975
ABSTRACT The ability of assistants to screen for elevated intraocular pressure (IOP) with the non‐contact tonometer was calculated. They bad ten minute of instruction with the instrument prior to the study. Theestimates by the estimates by the assistant corrclated highly with those of the optometrists.
W, Sagan, K, Schwaderer
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An overview of non-contact photoplethysmography

2017 25th Signal Processing and Communications Applications Conference (SIU), 2017
Photoplethysmography (PPG) is a method which is used to extract physiological parameters such as heart pulse rate, respirotary rate, and their variation with respect to time by optically measuring the blood volume change in the tissue. Photoplethysmography methods can be categorized into two groups: contact and non-contact.
Halil Demirezen, Cigdem Eroglu Erdem
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Non-Contact Stiffness Imager

IEEE International Conference on Robotics and Automation, 2004. Proceedings. ICRA '04. 2004, 2004
This paper proposes a Non-Contact Stiffness Imager that can enhance the definition of a stiff point by imparting a fluid force to the environment. The force is applied to the environment at a local point and displacement of the environment is measured in the surrounding area.
Tomohiro Kawahara   +2 more
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Effects of Non-Contact Tonometry on Refraction

Optometry and Vision Science, 1976
ABSTRACT The spherical component of refractive error was measured subjectively before and after noncontact tonometry in 19 eyes and also on the fellow (control) eyes without tonometry. No significant change in this measure of refractive error was found after tonometry. The tested group could not be distinguished from the control group.
A, Augsburger, M, Polasky
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Non-contact AFM

Journal of Physics: Condensed Matter, 2012
This special issue is focussed on high resolution non-contact atomic force microscopy (AFM). Non-contact atomic force microscopy was established approximately 15 years ago as a tool to image conducting and insulating surfaces with atomic resolution. Since 1998, an annual international conference has taken place, and although the proceedings of these ...
Franz J Giessibl, Seizo Morita
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