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Ion Scattering Spectroscopy and Particle Induced X-Ray Emission
1981Physical processes occurring during ion bombardment of solids are suitable for the analysis of thin layers providing information on the atomic masses present on the bombarded surface.This lecture deals with the wide angle scattering of light particles at MeV energy (R.B.S.) or at keV energy (I.S.S.).
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PIXE, Particle Induced X-ray Emission a concise review
2022PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-destructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.
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Particle-induced X-ray emission spectrometry (PIXE)
Choice Reviews Online, 1996openaire +2 more sources
TUMOR ANALYSIS BY PARTICLE‐INDUCED X‐RAY EMISSION (PIXE)
Acta Pharmacologica et Toxicologica, 1986openaire +2 more sources
Particle induced gamma and X-ray emission spectroscopies of lithium based alloy coatings
Nuclear Instruments & Methods in Physics Research B, 2017Jamie Laird +2 more
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Transition-Edge Sensors for Particle Induced X-ray Emission Measurements
Journal of Low Temperature Physics, 2013Ilari Maasilta +2 more
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