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Surface sensitive particle-induced X-ray emission
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2002A technique for quantitative and non-destructive surface spectroscopy using charged particle X-ray production at grazing exit angles is described. The enhanced surface sensitivity derives from: (i) the effect of refraction which increases the probability for emission near the critical angle, and (ii) self-absorption for those photons emitted at depth ...
W.N Lennard +2 more
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Particle-induced X-ray emission of light elements
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991Abstract With an X-ray detector capable of measuring photons at an energy as low as 300 eV, it is possible to perform PIXE analysis of light elements. In combination with RBS the X-ray production of N, O and F as a function of the incident proton or He-ion energy can be quantified.
M.F.C. Willemsen, A.E.T. Kuiper
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Particle Induced X-ray Emission at Mercury and the Moon.
2020<p>Mercury and the Moon are examples of terrestrial bodies which lack an atmosphere and therefore have surfaces which interact directly with the space environment. Thus the surfaces can be reprocessed by plasma impact, and in the process can emit X-rays via the Particle Induced X-ray Emission (PIXE) process.
Manuel Grande, Rose Cooper
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MEDICAL APPLICATIONS OF PARTICLE-INDUCED X-RAY EMISSION
International Journal of PIXE, 2008We report two medical applications of particle-induced X-ray emission (PIXE) as described below (1) Observation of biological events: The kinetics of trace elements during the initiation of radiation-induced apoptosis (RIA) was observed using a micro-PIXE and PIXE.
S. HARADA +10 more
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Particle-Induced X-Ray Emission
2018PIXE was first proposed by Sven Johansson in 1970 [1]. This method of analysis is based on the emission of characteristic X-rays from a sample after inner-shell ionization with ions from accelerators. In comparison to other analytical techniques based on X-ray spectrometry, such as EPMA and XRF, the ion beams generate fewer continuous X-rays, which ...
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Particle-Induced X-Ray Emission
1986Abstract Particle-induced x-ray emission (PIXE) is one of several quantitative analyses based on characteristic x-rays. This article provides a detailed account on the principles of PIXE, discussing the data-reduction codes used to identify, integrate, and reduce x-ray peaks into elemental concentrations.
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Analysis of proteins by particle induced X-ray emission
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2005The development of a standard PIXE procedure dedicated to the metal analysis in proteins is of great interest for biochemists. In order to achieve this aim, the LIPSION microprobe facility at the Leipzig University was used with a 2.25 MeV scanning proton micro-beam for the investigation of several test systems with known metal concentrations and ...
H. Natal da Luz +3 more
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Trace element detection by the particle induced X-ray emission process
International Journal of Nuclear Medicine and Biology, 1981Abstract This review article deals with the particle induced X-ray emission (PIXE) process and its use as an analytical method to detect and measure trace elements. The versatility of this method in biological, medical and environmental studies is described.
S, Monaro, R, Lecomte
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Evaluation of Nigerian Animal Feeds by Particle-Induced X-Ray Emission
Biological Trace Element Research, 2005There is need to evaluate the locally available animal feeds in Nigeria so as to be able to combine them in acceptable proportions to the animals to achieve the desired growth rate. The technique of particle-induced X-ray emission (PIXE) was employed for the evaluation of these locally available animal feeds, which include Panicum maximum (Guinea grass)
S O, Olabanji +5 more
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Proton induced X-ray emission of spherical particles: Corrections for X-ray attenuation
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990Abstract The intensity of X-rays from PIXE (particle induced X-ray emission) analysis of particulate matter may be reduced relative to that expected from thin samples because of two effects: reduced X-ray cross sections due to proton energy loss, and X-ray attenuation.
D.G. Jex, M.W. Hill, N.F. Mangelson
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