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15th International Conference on Particle Induced X-ray Emission (“PIXE2017”)

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2018
Uvodnik posebnog broja časopisa Nuclear Instruments and Methods Section B posvećen 15. međunarodnoj konferenciji o česticama induciranom X-zračenju, održanoj u Splitu u travnju 2017. godine.
Orlić, Ivica   +2 more
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Alpha Particle Induced X-ray Emission in the Classroom

AIP Conference Proceedings, 2003
We report on an experimental demonstration in an introductory modern physics course to elucidate the X‐ray line spectra, and how they arise from transitions of electrons to inner shells. We seek to determine the effect of limited use of an interactive component as a supplement to a traditional lecture, and how it would improve the student achievement ...
openaire   +1 more source

A compact wavelength-dispersive X-ray spectrometer for particle-induced X-ray emission analysis

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1996
Abstract A new compact wavelength-dispersive X-ray spectrometer has been developed for our compact high energy ion microprobe system (“mikro-i”). This spectrometer is designed to detect four light elements, boron, carbon, nitrogen and oxygen. Using two multilayer X-ray analyzers, multilayer benders cut from a single metal block and a gas-proportional
Y. Furukawa   +4 more
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Micron X-ray computed tomography based on micro-particle-induced X-ray emission

International Journal of PIXE, 2015
Particle-induced X-ray emission (PIXE) is a phenomenon of atomic inner shell ionization and characteristic X-ray emission due to ion-atomic collisions. The intensity of continuous X-rays in the PIXE energy spectrum is much lower than that of characteristic X-rays. Therefore, PIXE can be used as a semi-monochromatic X-ray source.
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Chapter 3 Particle Induced X-Ray Emission (PIXE)

1988
Publisher Summary The analytical use of particle induced X-ray emission (PIXE) spectroscopy has become an important tool in the biomedical field, especially in those cases, where only small amounts of sample matter are available. An important feature of the PIXE method is that the background in the X-ray spectra that limits the power of detection is ...
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Ion Scattering Spectroscopy and Particle Induced X-Ray Emission

1981
Physical processes occurring during ion bombardment of solids are suitable for the analysis of thin layers providing information on the atomic masses present on the bombarded surface.This lecture deals with the wide angle scattering of light particles at MeV energy (R.B.S.) or at keV energy (I.S.S.).
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PIXE, Particle Induced X-ray Emission a concise review

2022
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-destructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.
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Particle induced X-ray emission and Rutherford backscattering spectrometry for testing homogeneity of environmental certified reference material candidates

International Journal of Environmental Analytical Chemistry, 2021
Abubakr M Idris   +2 more
exaly  

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