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A fast process variation and pattern fidelity aware mask optimization algorithm

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2014
Ahmed Awad 0002   +3 more
openaire   +1 more source

Scalable, High-Fidelity Monitoring of Application Communication Patterns in Vernier

Proceedings of the SC '25 Workshops of the International Conference for High Performance Computing, Networking, Storage and Analysis
Jered Dominguez-Trujillo   +8 more
openaire   +1 more source

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