Effect of RF discharge structure on etching rate in plasma-chemical reactor
2010 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering (SIBIRCON), 2010The effect of RF discharge structure on silicon etching process in CF 4 /O 2 mixture was studied. The calculations were carried out based on an advanced mathematical model of plasma-chemical reactor with taking into account a peculiarities of RF discharge plasma.
Yurii Grigoryev, Aleksey Gorobchuk
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Analysis of hydrogen plasma in a microwave plasma chemical vapor deposition reactor
Journal of Applied Physics, 2016The aim of this work is to build a numerical model of hydrogen plasma inside a microwave plasma chemical vapor deposition system. This model will help in understanding and optimizing the conditions for the growth of carbon nanostructures. A 2D axisymmetric model of the system is implemented using the finite element high frequency Maxwell solver and the
G. Shivkumar +4 more
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Plasma chemical reactor for precision etching of elements with submicron size
IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science, 2002Summary form only given, as follows. We have created a plasma chemical reactor with the possibility of ion energy control from 50 W up to 500 W and more. In the main working regime the ion energy is regulated in the range 50-150 W. It is shown the etching velocity of Al films is /spl nu//sub et//spl les/0.5 /spl mu/m/min at the anisotropy coefficient q>
V.N. Pavlenko, V.G. Panchenko
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Synthesis of silicon carbide nanopowders in a two-jet plasma-chemical reactor
Thermophysics and Aeromechanics, 2017Results of experimental studies on production of nanostructured silicon carbide powders in a plasma-chemical reactor based on a two-jet plasmatorch are presented. The conditions of SiC formation as a function of temperature and composition of the initial components are determined by thermodynamic calculations.
A. S. Anshakov +4 more
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Numerical modeling of two RF discharge structure in plasma-chemical etching reactor
2013 International Siberian Conference on Control and Communications (SIBCON), 2013The plasma-chemical etching technology in RF discharge was simulated in hydrodynamical approach. The calculations based on the mathematical model of plasma-chemical reactor in which gas flow was described by the convective-diffusion equations of multicomponent physical-chemical hydrodynamics.
Yurii N. Grigoryev, Aleksey G. Gorobchuk
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Investigations of fullerenes and their derivatives synthesized in the plasma chemical reactor
AIP Conference Proceedings, 1998The x-ray investigations of products of synthesis and the results of investigations of iron-containing compounds of fullerene obtained in a plasma chemical reactor (PCR), and medical-biological investigations of water-soluble fullerene-iron-acetylacetone complexes are presented.
S. G. Ovchinnikov +10 more
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Effect of HF discharge structure on etch nonuniformity in plasma-chemical reactor
Russian Microelectronics, 2014Numeric simulation is used to study the effect of the high-frequency (HF) discharge structure on the process of plasma-chemical etching of silicon in a mixture of CF4/O2. The calculations are carried out using a mathematical model of a nonisothermal reactor, in which the gas mixture motion was described with the help of equations of multicomponent ...
Yu. N. Grigor’ev, A. G. Gorobchuk
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On the feasibility of a plasma-chemical reactor for hydrogen production
Technical Physics, 2003It is proposed that a high-frequency discharge in humid air be used as a model of a plasma-chemical reactor for hydrogen production.
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Optimization of the Length of the Active Zone of a Plasma Chemical Reactor
Theoretical Foundations of Chemical Engineering, 2003The optimum length of the active zone of a plasma chemical reactor is calculated using a semiempirical approach in terms of a mathematical model of coupled physicochemical and thermophysical processes in the reactor.
V. K. Semenov +2 more
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Behavior of downstream plasmas generated in a microwave plasma chemical-vapor deposition reactor
Journal of Applied Physics, 1988The behavior of electron-cyclotron resonant (ECR) and non-ECR H2 plasmas generated in a microwave plasma chemical-vapor deposition reactor have been studied as a function of magnetic field strength and absorbed microwave power. Plasma diagnostics were performed with a planar electrostatic probe, microwave power measurements, and visual inspection.
P. K. Shufflebotham +2 more
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