Results 181 to 190 of about 1,533,069 (297)

Defect‐Templated Phase Engineering in Atomically Thin Metals

open access: yesAdvanced Materials, EarlyView.
Graphene defects are transformed from passive imperfections into programmable templates for phase‐selective growth of atomically thin silver. Plasma‐generated boundary defects favor Ag(1), whereas sp3‐rich zero‐layer graphene promotes Ag(2). This defect‐directed intercalation links local graphene chemistry to crystalline phase, electronic structure ...
Arpit Jain   +25 more
wiley   +1 more source

Ion Concentration and Voltage Imaging With Fluorescent Nanodiamonds

open access: yesAdvanced Materials, EarlyView.
We demonstrate reversible switching between the fluorescent NV0 and the dark NV+ state, in sub‐30 nm FNDs via surface oxidation and hydrogenation, respectively. In an electrochemical cell, we show that the fluorescence from hydrogenated particles enables all‐optical imaging of voltages and ion concentrations at the micrometer scale.
Patrick Voorhoeve   +8 more
wiley   +1 more source

All‐Amyloid Functional Coacervates

open access: yesAdvanced Materials, EarlyView.
This study introduces an all‐amyloid interfacial complex coacervate technique that employs charge‐mediated or functionalization‐assisted complexation of oppositely charged food protein‐derived amyloid nanofibrils to engineer functional soft constructs across multiple length scales.
Seyyed Alireza Hashemi   +4 more
wiley   +1 more source

Extreme Bond Ionicity in Mg─Te Chalcogenides for Ultrathin Low Voltage Selector‐Only Memory beyond the Leakage Scaling Limit

open access: yesAdvanced Materials, EarlyView.
Mg─Te chalcogenides address the leakage scaling trade‐off in ultrathin selector‐only memory. Structural partitioning in multiphase Mg─Te, combined with highly ionic Mg─Te bonding and Hf interfacial engineering, supports reliable 5 nm thickness operation at low write voltage with suppressed leakage current, narrow threshold voltage distributions, 10 ns ...
Yoori Seo   +5 more
wiley   +1 more source

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