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Chemical and mechanical extraction for egyptian safflower bio-oil with a performance and economic analysis for renewable fuel applications. [PDF]
Kamel MA +4 more
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Robust coffee plant disease classification using deep learning and advanced feature engineering techniques. [PDF]
Ardah H +3 more
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Adaptive linear MPC for a PMSM-driven autonomous EV with a filtered third-order generalized integrator observer. [PDF]
Ismail MM +4 more
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Knowledge stickiness and technological concentration in the AI industry: an empirical study of Chinese cities. [PDF]
Zhang L, Zhang Q, Meng H.
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Transfer function with quadratic detection: coherent illumination
Journal of the Optical Society of America, 1980The visibility of the interference terms over the image irradiance of a complex amplitude object immersed in a uniform background is described by an interference transfer function (ITF). It is shown that the ITF is the linear transfer function for coherent optical systems with quadratic detection when the test object either has low contrast or is ...
J. Ojeda-CastaƱeda, E. Jara
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Automatica, 2014
zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Joerg Raisch +2 more
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zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Joerg Raisch +2 more
exaly +4 more sources
Transfer function of coherent optical systems with quadratic detection
Journal of the Optical Society of America, 1979A method for designating a transfer function of a coherent optical system with quadratic detection is given in the paper. This function may be used as a measure for the evaluation of quality of coherent optical systems.
Marek Zajac
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A Numerical Evaluation of the Quadratic Transfer Function for a Floating Structure
Volume 7A: Ocean Engineering, 2019Abstract The second order force of a floating structure can be expressed in terms of a time independent quadratic transfer functions along with the incident wave elevation, through which it is possible to evaluate the second order wave exciting forces in the frequency domain.
Falzarano Jeffrey
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Optical Microlithography XXXIII, 2020
The impacts of aberrations to lithographic metrics, such as defocus, pattern shift and NILS loss, needs to be calculated quickly in numerous applications of the lithography. This paper presents a fast algorithm for calculating these typical lithographic metrics of scanner.
Shiyuan Liu, Xiuguo Chen, Yating Shi
exaly +2 more sources
The impacts of aberrations to lithographic metrics, such as defocus, pattern shift and NILS loss, needs to be calculated quickly in numerous applications of the lithography. This paper presents a fast algorithm for calculating these typical lithographic metrics of scanner.
Shiyuan Liu, Xiuguo Chen, Yating Shi
exaly +2 more sources

