Results 91 to 100 of about 41,273 (213)

Research Progress and Applications of Non‐Carrier‐Injection Electroluminescence

open access: yesAdvanced Electronic Materials, EarlyView.
Non‐carrier‐injection electroluminescence (NCI‐EL) uses AC fields and displacement currents to trigger light from internal charge reservoirs, enabling minimalist emitters with remotely coupled terminals. This review maps shared mechanisms across organics, GaN, quantum dots, and TMDCs, compares planar, interdigital, single‐terminal, and coaxial designs,
Wei Huang   +6 more
wiley   +1 more source

Compatibility in multiparameter quantum metrology [PDF]

open access: yesPhysical Review A, 2016
v2: Corrected form of the Holevo Cramer-Rao bound, other minor ...
Ragy, Sammy Hany   +2 more
openaire   +3 more sources

Probing cosmic string spacetime through parameter estimation

open access: yesEuropean Physical Journal C: Particles and Fields, 2022
Quantum metrology studies the ultimate precision limit of physical quantities by using quantum strategy. In this paper we apply the quantum metrology technologies to the relativistic framework for estimating the deficit angle parameter of cosmic string ...
Ying Yang, Jiliang Jing, Zehua Tian
doaj   +1 more source

Quantum metrology for relativistic quantum fields

open access: yes, 2013
In quantum metrology quantum properties such as squeezing and entanglement are exploited in the design of a new generation of clocks, sensors and other measurement devices that can outperform their classical counterparts.
Ahmadi, Mehdi   +2 more
core   +1 more source

AI‐Guided Co‐Optimization of Advanced Field‐Effect Transistors: Bridging Material, Device, and Fabrication Design

open access: yesAdvanced Intelligent Discovery, EarlyView.
This article outlines how artificial intelligence could reshape the design of next‐generation transistors as traditional scaling reaches its limits. It discusses emerging roles of machine learning across materials selection, device modeling, and fabrication processes, and highlights hierarchical reinforcement learning as a promising framework for ...
Shoubhanik Nath   +4 more
wiley   +1 more source

Entanglement-assisted quantum metrology

open access: yes, 2016
Entanglement-assisted quantum communication employs pre-shared entanglement between sender and receiver as a resource. We apply the same framework to quantum metrology, introducing shared entanglement between the preparation and the measurement stage ...
Huang, Zixin   +2 more
core   +1 more source

Quantum resistance metrology in graphene [PDF]

open access: yes, 2008
We have performed a metrological characterization of the quantum Hall resistance in a 1 $\mu$m wide graphene Hall-bar. The longitudinal resistivity in the center of the $\nu=\pm 2$ quantum Hall plateaus vanishes within the measurement noise of 20 m ...
A. J. M. Giesbers   +8 more
core   +3 more sources

Pancake Lenses through Curved Lamination for Compact Virtual Reality

open access: yesAdvanced Intelligent Systems, EarlyView.
This article presents an ultrathin VR optical system based on a 1.35 in. microdisplay, leveraging curved lamination technology. Compared to mainstream solutions, the proposed design demonstrates superior compactness (volume compression by 12%) and enhanced optical performance.
Jiaping Sun   +5 more
wiley   +1 more source

The best Fisher is upstream: data processing inequalities for quantum metrology [PDF]

open access: yes, 2014
We apply the classical data processing inequality to quantum metrology to show that manipulating the classical information from a quantum measurement cannot aid in the estimation of parameters encoded in quantum states.
Ferrie, Christopher
core   +1 more source

Entropy‐Guided Convolutional Neural Network Classification of Sensor Signals for Real‐Time Surface Quality Monitoring in Direct Laser Interference Patterning

open access: yesAdvanced Intelligent Systems, EarlyView.
Neural‐network pipeline for real‐time DLIP surface‐quality monitoring: spectral entropy of WLI topographies is used to generate interpretable K‐means labels, which are transferred to time‐resolved photodiode traces. A compact dual‐input 1D‐CNN (signal + laser parameters) learns discriminative spatiotemporal features and predicts “OK/NOK” surface ...
Marcelo Daniel Sallese   +4 more
wiley   +1 more source

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