Results 111 to 120 of about 25,276 (306)

A study on the radiation hardness of lead tungstate crystals [PDF]

, 1997
This report presents recent progress of a study on the radiation damage in lead tungstate (PbWO_4) crystals. The dose rate dependence of radiation damage in PbWO_4 has been observed.
Zhu, R. Y., Deng, Q., Stoll, S. P., Newman, H., Woody, C. L., Kierstead, J. A.   +5 more
core  

Study of the Influence of the Voltage Regulator Integrated Circuit Topology on its Radiation Hardness

Приборы и методы измерений
Method of recording responses to radiation exposure is considered using the X-ray complex RIK-0401 and it is shown that for linear voltage regulators integrated circuits it allows diagnosing presence of changes in their topology. Four types of integrated
Е. A. Кulchenkov, A. A. Demidov, S. B. Rybalka   +2 more
doaj   +1 more source

The influence of CeF₃ on radiation hardness and luminescence properties of Gd₂O₃-B₂O₃ glass scintillator. [PDF]

Sci Rep, 2022
Kaewnuam E, Wantana N, Ruangtaweep Y, Cadatal-Raduban M, Yamanoi K, Kim HJ, Kidkhunthod P, Kaewkhao J.   +7 more
europepmc   +1 more source

Phase Engineering of Nanomaterials (PEN): Evolution, Current Challenges, and Future Opportunities

Advanced Materials, EarlyView.
This review summarizes the synthesis, phase transition, advanced characterization spanning ex situ to in situ and operando techniques, and diverse applications of phase engineering of nanomaterials (PEN). It further outlines key challenges and future opportunities, such as phase stability, architecture control, and artificial intelligence (AI)‐driven ...
Ye Chen, Zhanxi Fan, Jingjie Ge, Qiyuan He, Zhuangchai Lai, Jiawei Liu, Chaoliang Tan, Hua Zhang   +7 more
wiley   +1 more source

An Unsupervised Learning Approach to Validate the Robustness of Octagonal MOSFETs in X-Ray Environments

IEEE Access
This work presents a comparative statistical investigation into the enhanced ionizing radiation hardness between the Octagonal (OnM) and Conventional (CnM) MOSFETs under X-ray environment. The primary objective is to quantify the robustness of OnM across
Vinicius Vono Peruzzi, Daniel Marchesi De Camargo Neves, Fernando Rezende Zagatti, Gilson Yuuji Shimizu, Wellington Romeiro De Melo, Luis Eduardo Seixas, Saulo Finco, Salvador Pinillos Gimenez   +7 more
doaj   +1 more source

Lead Halide Perovskite Photoelectrocatalysis

Advanced Materials, EarlyView.
Lead halide perovskite semiconductors have emerged as highly promising materials for solar fuel and chemical synthesis. This perspective discusses advances made in the rational photoelectrode design to improve solar‐to‐chemical conversion, product scope, and scalability.
Virgil Andrei
wiley   +1 more source

CdZnTe Radiation Hardness Increasing by Laser Radiation

Radiation damage occured in semiconductors devices during their operation and it impairds the ability of equipment. The work deals with study of possibility to increase the radiation hardness of CdZnTe crystal using laser ...
Daukšta, Edvīns, Mičko, Aleksandrs, Diéguez, Ernesto, Medvids, Artūrs, Naseka, Yuriy   +4 more
core  

Study of the Effects of Radiation Exposure on the Parameters of Selected Silicon Photomultipliers

Signals
Silicon photomultipliers (SiPMs) have become widely used as photodetectors in high-energy physics, nuclear physics, medical imaging, and space applications.
Ian G. Bearden, Valentin Buchakchiev, Daniel Ivanov, Mira Gencheva, Venelin Kozhuharov, Yury A. Melikyan   +5 more
doaj   +1 more source

Radiation Hardness Property of Ultra-Fast 3D-Trench Electrode Silicon Detector on N-Type Substrate. [PDF]

Micromachines (Basel), 2021
Liu M, Li X, Cheng W, Li Z, Li Z.
europepmc   +1 more source

Low Resistance Interphase Formation at the PEO‐LiTFSI|LGPS Interface in Lithium Solid‐State Batteries

Advanced Materials Interfaces, EarlyView.
Interfacial charge transfer and low‐resistance interphase formation between PEO‐based polymer and Li10GeP2S12 solid electrolytes are investigated using multi‐electrode impedance spectroscopy and advanced analytical techniques such as XPS and ToF‐SIMS.
Ujjawal Sigar, Timo Weintraut, Sebastian L. Benz, Semih Engün, Sascha Kremer, Anja Henss, Felix H. Richter   +6 more
wiley   +1 more source