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Defect-Based Compact Modeling of Random Telegraph Noise

2020
This chapter handles compact modeling of RTN and BTI with the main focus on the statistical component of reliability. A comprehensive overview of the State-of-the-Art(SotA) BTI distribution models will be given. Of these, the Exponential-Poisson distribution, describing BTI from the defect-centric point of view, is considered as the SotA.
Weckx, Pieter   +4 more
openaire   +2 more sources

Shot-Noise-Induced Random Telegraph Noise in Shuttle Current

Physical Review Letters, 2002
Random telegraph noise in the electric current produced by shot noise is predicted for an array of movable colloid particles by Monte Carlo and molecular dynamics calculations. The electron transport is attributed to the shuttle mechanism where moving colloid particles carry charges. The colloid-particle motion induced by the source-drain voltage shows
openaire   +3 more sources

Random Telegraph Noise in Laser-Assisted Collisions

Europhysics Letters (EPL), 1987
We present a treatment of potential scattering of a charged particle in a laser field undergoing jumplike fluctuations in amplitude, phase or frequency. Our method allows the inclusion of these three types of noise in a unified way for the case of random telegraph and, more generally, of pre-Gaussian statistics.
Francken, Philippe, Joachain, Charles
openaire   +1 more source

Random telegraph noise analysis in time domain

Review of Scientific Instruments, 2000
A new procedure for analysis of random telegraph signals in time domain has been developed and applied to the analysis of voltage fluctuations in the current induced dissipative state in superconducting thin films. The procedure, based entirely on the difference in the statistical properties of discrete Marcovian telegraph fluctuations and Gaussian ...
Y. Yuzhelevski, M. Yuzhelevski, G. Jung
openaire   +1 more source

Random telegraphic noise in double barrier systems

Applied Physics Letters, 1993
A random telegraphic noise (RTN) in a resonant tunneling device (RTD) has been found through a self-consistent particle Monte Carlo (MC) simulation with model quantum dynamics. The onset of RTN coincides with the onset of tunneling conduction, and with the onset of the low-current valley region of the current-voltage (I-V) characteristic.
R. E. Salvino, F. A. Buot
openaire   +1 more source

Spectrum of anomalous random telegraph noise

Journal of Applied Physics, 1993
The alternate capture and emission of electrons at an individual defect site generates discrete switching in resistance, referred to as a random telegraph signal (RTS). Recent experiments indicate that some defects might have two mutually exclusive emission modes with distinct emission rates, which result in the anomalous RTS: a rapid-switching RTS ...
openaire   +1 more source

Random telegraph noise of deep-submicrometer MOSFETs

IEEE Electron Device Letters, 1990
The random telegraph noise exhibited by deep-submicrometer MOSFETs with very small channel area ( >
K.K. Hung, P.K. Ko, C. Hu, Y.C. Cheng
openaire   +1 more source

Resistive Switching Devices Producing Giant Random Telegraph Noise

IEEE Electron Device Letters, 2022
Resistive switching (RS) has been studied for several applications such as information storage and bio-inspired computing, although reliability issues still prevent their massive use. In this work, we present a novel observation of trapping activity that imposes giant random conductance fluctuations, up to 3 orders of magnitude, resembling RTN in RS ...
Thales Becker   +5 more
openaire   +2 more sources

On the amplitude of random telegraph noise

Proceedings of Technical Program of 2012 VLSI Technology, System and Application, 2012
A simple physical model is developed to show that the “hole-in-the-inversion-layer” model for RTN is in fact correct. This simple model allows RTN amplitude for future devices to be predicted intuitively and quantitatively. The model provides additional incite into the physics of RTN in MOSFETs.
K. P. Cheung   +3 more
openaire   +1 more source

Random telegraph noise in a nickel nanoconstriction

Journal of Applied Physics, 2003
Nickel nanoconstrictions about 20 nm wide produced by electron beam lithography in a 60 nm nickel film exhibit resistivities in the kΩ range with a nonlinear and asymmetric I–V characteristic. Noise spectra of the contacts sometimes deviate from 1/f behavior due to random telegraph fluctuations at room temperature with a frequency in the 10 Hz range ...
O. Céspedes   +4 more
openaire   +1 more source

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