Results 91 to 100 of about 131 (104)
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Random Telegraph Signal Noise in Gate-All-Around Si-FinFET With Ultranarrow Body
IEEE Electron Device Letters, 2006D S H Chan, L K Bera, G Q Lo
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New Weighted Time Lag Method for the Analysis of Random Telegraph Signals
IEEE Electron Device Letters, 2014J Martín-Martínez +2 more
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Evidence of a Novel Source of Random Telegraph Signal in CMOS Image Sensors
IEEE Electron Device Letters, 2011Vincent Goiffon +2 more
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Random telegraph signal currents and low-frequency noise in junction field effect transistors
IEEE Transactions on Electron Devices, 1994K Kandiah
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Random Telegraph Signal noise properties of HfOx RRAM in high resistive state
2012Francesco Maria Puglisi +2 more
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Characteristics of Random Telegraph Signal Noise in CMOS Image Sensors With Digital Domain Binning
IEEE Transactions on Electron DevicesJiangtao Xu, Wanbin Zha
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