Results 121 to 130 of about 1,687 (140)

A Real-time Auto-detection Method for Random Telegraph Signal (RTS) Noise Detection in CMOS Active pixel sensors

Journal of Instrumentation, 2015
CMOS Active pixel sensors (CMOS APS) are attractive for use in the innermost layers of charged particle trackers, due to their good tradeoffs among the key performances. However, CMOS APS can be greatly influenced by random telegraph signal (RTS) noise, which can cause particle tracking or energy calculation failures.
R. Zheng, R. Zhao, Y. Ma, B. Li, X. Wei, J. Wang, W. Gao, T. Wei, D. Gao, Y. Hu   +9 more
openaire   +1 more source

Random telegraph signal (RTS) noise and other anomalies in the near-infrared detector systems for the Euclid mission

SPIE Proceedings, 2016
Euclid is an ESA mission to map the geometry of the dark Universe with a planned launch date in 2020. Euclid is optimised for two primary cosmological probes, weak gravitational lensing and galaxy clustering. They are implemented through two science instruments on-board Euclid, a visible imager (VIS) and a near-infrared spectro-photometer (NISP), which
Kohley, R., Barbier, R., Kubik, B., Ferriol, S., Clemens, J.-C., Ealet, A., Secroun, A., Conversi, L., Strada, P.   +8 more
openaire   +1 more source

Subthreshold Leakage Due to 1/F Noise and Rts(Random Telegraph Signals)

2007 IEEE Workshop on Microelectronics and Electron Devices, 2007
An analysis of subthreshold leakage predicts a Gaussian or Normal distribution on large devices but a distorted distribution is possible on small devices. 1/f noise due to RTS signals on large well behaved devices will have a Gaussian distribution and cause a Gaussian current distribution under normal and subthreshold operating conditions.
Drake A. Miller, Panupat Poocharoen, Leonard Forbes   +2 more
openaire   +1 more source

New Weighted Time Lag Method for the Analysis of Random Telegraph Signals

IEEE Electron Device Letters, 2014
Javier Martin, Rosana Rodriguez, Montserrat Nafria   +2 more
exaly  

Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High-$k$ Dielectric/Metal Gate

IEEE Electron Device Letters, 2011
Ga-Won Lee
exaly  

Random Telegraph Signal Noise in Gate-All-Around Si-FinFET With Ultranarrow Body

IEEE Electron Device Letters, 2006
Yee-Fun Lim
exaly  

Effects of High-Pressure Annealing on Random Telegraph Signal Noise Characteristic of Source Follower Block in CMOS Image Sensor

IEEE Electron Device Letters, 2013
Sung-Kyu Kwon, Ho-Young Kwak, Hi-Deok Lee   +2 more
exaly  

Shallow Trench Isolation Edge Effect on Random Telegraph Signal Noise and Implications for Flash Memory

IEEE Transactions on Electron Devices, 2009
Andrea Ghetti
exaly  

RTS Noise Characterization in Single-Photon Avalanche Diodes

IEEE Electron Device Letters, 2010
Mohammad Azim Karami, Cristiano Niclass, Edoardo Charbon   +2 more
exaly  

In-Pixel Source Follower Transistor RTS Noise Behavior Under Ionizing Radiation in CMOS Image Sensors

IEEE Transactions on Electron Devices, 2012
Vincent Goiffon
exaly