Results 131 to 140 of about 1,687 (140)

Study of Gate Oxide/Channel Interface Properties of SON MOSFETs by Random Telegraph Signal and Low Frequency Noise

IEEE Nanotechnology Magazine, 2011
Nabil Sghaier
exaly  

Random telegraph signal noise simulation of decanano MOSFETs subject to atomic scale structure variation

Superlattices and Microstructures, 2003
Andrew R Brown
exaly  

Random telegraph signal noise in gate-all-around silicon nanowire transistors featuring Coulomb-blockade characteristics

Applied Physics Letters, 2009
Lianglia Zhang, Runsheng Wang
exaly  

Discrete Dopant Effects on Statistical Variation of Random Telegraph Signal Magnitude

IEEE Transactions on Electron Devices, 2007
exaly  

RTS Noise Characterization in Flash Cells

IEEE Electron Device Letters, 2008
exaly  

Relating random telegraph signal noise in metal-oxide-semiconductor transistors to interface trap energy distribution

Applied Physics Letters, 2005
exaly  

Random telegraph signal currents and low-frequency noise in junction field effect transistors

IEEE Transactions on Electron Devices, 1994
exaly  

Characteristics of Random Telegraph Signal Noise in CMOS Image Sensors With Digital Domain Binning

IEEE Transactions on Electron Devices
Wanbin Zha, Jiangtao Xu
exaly  

Explaining the amplitude of RTS noise in submicrometer MOSFETs

IEEE Transactions on Electron Devices, 1992
exaly  

The gate bias and geometry dependence of random telegraph signal amplitudes [MOSFET]

IEEE Electron Device Letters, 1997
exaly