Remote Sensing of Environment, 2015 Optical methods to study soil moisture content (SMC) are often based on empirically or physically based models that relate changes in reflectance intensity to SMC.
Peter Roosjen, Jan G P W Clevers
exaly +3 more sources
Discerning Black Phosphorus Crystal Orientation and Anisotropy by Polarized Reflectance Measurement
ACS Applied Materials & Interfaces, 2018 Strong in-plane anisotropy of atomic layer and thin-film black phosphorus (P) offers new device perspectives and stimulates increasing interest and explorations, where precisely determining the black P crystal orientation and anisotropic axes is a ...
Arnob Islam, Vida Pashaei, Hao Jia
exaly +3 more sources
Chiral Porphyrin Assemblies Investigated by a Modified Reflectance Anisotropy Spectroscopy Spectrometer [PDF]
Molecules, 2023 Reflectance anisotropy spectroscopy (RAS) has been largely used to investigate organic compounds: Langmuir–Blodgett and Langmuir–Schaeffer layers, the organic molecular beam epitaxy growth in situ and in real time, thin and ultrathin organic films ...
Ilaria Tomei +10 more
doaj +2 more sources
The importance of surface reflectance anisotropy for cloud and NO2 retrievals from GOME-2 and OMI [PDF]
Atmospheric Measurement Techniques, 2018 The angular distribution of the light reflected by the Earth's surface influences top-of-atmosphere (TOA) reflectance values. This surface reflectance anisotropy has implications for UV/Vis satellite retrievals of albedo, clouds, and trace gases such ...
A. Lorente +8 more
doaj +2 more sources
Precise in situ etch depth control of multilayered III-V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment. [PDF]
Beilstein J Nanotechnol, 2016 Reflectance anisotropy spectroscopy (RAS) equipment is applied to monitor dry-etch processes (here specifically reactive ion etching (RIE)) of monocrystalline multilayered III–V semiconductors in situ. The related accuracy of etch depth control is better
Kleinschmidt AK +7 more
europepmc +2 more sources
Reflectance anisotropy of Gd5Si2Ge2 and Tb5Si2.2Ge1.8 [PDF]
Applied Physics Letters, 2004 Reflectance difference (RD) spectra for the a–b plane of the single crystals of Gd5Si2Ge2and b–c planes of Gd5Si2Ge2 and Tb5Si2.2Ge1.8 were obtained in the photon energy range of 1.5–5.5 eV.
Snyder, J. +15 more
core +4 more sources
Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy
Hittite Journal of Science and Engineering, 2019 Rface and interface information. RAS measures the difference in reflectance of light eflectance anisotropy spectroscopy RAS is an optical technique to produce surlinearly polarised along two orthogonal axes in the surface at near normal incidence as ...
Orhan Zeybek
doaj +2 more sources
Changes in reflectance anisotropy of wheat crop during different phenophases
, 2017 The canopy structure of wheat changes significantly with growth stages and leads to changes in reflectance anisotropy. Bidirectional reflectance distribution function characterises the reflectance anisotropy of the targets, which can be approximated ...
Manoj M. Lunagaria +3 more
core +2 more sources
Polarimeters for the Detection of Anisotropy from Reflectance
MicromachinesPolarimetry is used to determine the Stokes parameters of a laser beam. Once all four S0,1,2,3 parameters are determined, the state of polarisation is established.
Shuji Kamegaki +9 more
doaj +3 more sources
The Classification of Reflectance Anisotropy and Its Application in Albedo Retrieval
Atmosphere, 2022 The land surface albedo reflects the ability of the surface to reflect solar radiation and is a critical physical variable in the study of the Earth’s energy budget and global climate change.
Mengzhuo Zhao +6 more
doaj +2 more sources