Results 51 to 60 of about 377 (127)

Ge/GaAs(001) interface formation investigated by reflectance anisotropy spectroscopy

, 1999
The formation of the Ge/GaAs(001) interface has been investigated following the transformation of an As-dimer terminated GaAs(001)(2 X 4) surface into a Ge-Ga-dimer terminated (1 X 2) reconstruction and the subsequent deposition up to 10 ML of Ge.
Emiliani, V., Goletti, C, Richter, W, RICHTER, WOLFGANG, Esser, N, Shkrebtii, AI, Fimland, BO, Emiliani, V, Esser, N., GOLETTI, CLAUDIO, Frisch, AM   +10 more
core   +1 more source

Theoretical reflectance anisotropy spectroscopy and scanning tunnelling microscopy study of the gaas(001) (2 × 4) surface

, 1996
The method of reflectance anisotropy spectroscopy (RAS) has proved extremely useful in monitoring the structure of semiconductor surfaces during growth under metal-organic vapour phase epitaxy conditions.
Morris, S. J., Matthai, Clarence Cherian, J.M. Bass, S.J. Morris, C.C. Matthai, Bass, J. M.   +5 more
core   +1 more source

Determination of Degree of Anisotropy of KTP Crystal Using Reflectance Anisotropy Spectroscopy Technique

, 2006
Reflectance anisotropy spectroscopy (RAS) is a non-distractive optical probe of surfaces that is capable of operation within a wide range of environments.
Gashaw, Fekadu
core  

Molecular orientation with visible light: reflectance-anisotropy spectroscopy of 3-thiophene carboxylate on Cu(110) surfaces

, 1998
We present reflectance-anisotropy spectroscopy data for the adsorption of 3-thiophene carboxylic acid on the clean and O(2 x 1)/Cu(110) surfaces, which demonstrates the sensitivity to orientation parallel and perpendicular to the surface.
Cole, RJ, Richardson, Neville Vincent, Weightman, P, Verdozzi, C, Sears, MP, Frederick, BG, Chen, Q, Schultz, PA, Jennison, DR, Perry, CC, Power, JR   +10 more
core  

Ab initio study of reflectance anisotropy spectra of a submonolayer oxidized Si(100) surface

, 2005
The effects of oxygen adsorption on the reflectance anisotropy spectrum (RAS) of reconstructed Si(100):O surfaces at submonolayer coverage (first stages of oxidation) have been studied by an ab initio density-functional theory local-density approximation
R. Del Sole, G. Onida, ONIDA, GIOVANNI, A. Incze, Del Sole, R, Onida, G, DEL SOLE, RODOLFO, Incze, A   +7 more
core   +1 more source

Optical Properties of Capped Metallic Nanostructures, Grown on Silicon

, 2011
Reflectance anisotropy spectroscopy (RAS) is a linear optical technique that measures the difference in the reflectance of two orthogonal polarisations at normal incidence.
McAlinden, Niall, McGilp, John
core  

Reflectance anisotropy spectroscopy and the growth of low-dimensional materials

, 1998
Reflectance anisotropy spectroscopy (RAS) has proved itself to be extremely sensitive to both surface reconstruction and ultrathin coverages of material on semiconductor surfaces.
D.I Westwood, Westwood, David I., Sobiesierski, Zbigniew, Z Sobiesierski   +3 more
core   +1 more source

Understanding Growth-Faulted GaAsBi Samples by Reflectance Anisotropy Spectroscopy

Reflectance anisotropy spectroscopy (RAS) has been recently applied to molecular beam epitaxy (MBE) of GaAsBi alloys. The presence of the voluminous Bi atoms induces strain in the crystal lattice, modifying the substrate symmetry of the centrosymmetric ...
Beatrice Bonanni, Elisa Tisbi, Claudio Goletti, Fabrizio Arciprete, Laura Fazi   +4 more
core   +1 more source

Surface versus bulk contributions from reflectance anisotropy and electron energy loss spectra of the GaAs(001) − c(4×4) surface

, 2003
We report on the results of a combined experimental study of the optical anisotropy of GaAs(001)-c(4x4) surfaces grown by molecular beam epitaxy and examined in situ by reflectance anisotropy spectroscopy (RAS) and high resolution electron energy loss ...
Goletti C., Patella F., Chiaradia P., Fanfoni M., BALZAROTTI, ADALBERTO, Hogan C., Balzarotti A., Placidi, E, CHIARADIA, PIETRO, FANFONI, MASSIMO, Placidi E., ARCIPRETE, FABRIZIO, Arciprete F., PATELLA, FULVIA, Hogan, C, GOLETTI, CLAUDIO   +15 more
core   +1 more source

In Situ Monitoring the Growth of Polypyrrole Films at Liquid Solid Interface Using a Combination of Polarized Infrared Spectroscopy and Reflectance Anisotropy Spectroscopy

, 2012
Polarized infrared reflection measurements in an ellipsometric set up and reflectance anisotropy spectroscopy RAS were used for the first time for combined in situ characterization of the electrochemical growth potentiostatic pulse method of thin ...
Hinrichs, K., Kaspari, C., Rappich, J., Haberland, K., Sun, G., Zhang, X.   +5 more
core   +1 more source