Results 131 to 140 of about 190,755 (383)
IIRW Deals With a Wide Spectrum of Semiconductor Reliability Challenges [PDF]
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A strongly correlated electron system (SCES) exhibits pronounced insulating behavior due to Coulombic repulsion between cations, which generates a charge gap. This study investigates the tuning of the band structure in NiWO4‐based SCES via Cu doping at substitutional sites and Li doping at interstitial sites.
Seung Yong Lee+18 more
wiley +1 more source
Semitransparent perovskite solar cells (PSCs) that possess a high-power conversion efficiency (PCE) and high average visible light transmittance (AVT) can be employed in applications such as photovoltaic windows.
Dazheng Chen+13 more
doaj +1 more source
Recently, the two-dimensional MA2Z4 family with a seven-atom layer structure (experimentally synthesized a MoSi2N4 monolayer), which has good stability and exhibits semiconductivity, providing a platform for photocatalytic hydrolysis studies of two ...
Yi Wang+7 more
doaj
Contamination Free Manufacturing of Semiconductor Devices for High Reliability [PDF]
Jagdish Prasad
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Phosphorescent OLEDs suffer from efficiency roll‐off due to triplet‐polaron quenching (TPQ). This study demonstrates for a large set of host‐guest combinations a spectroelectrochemical method to measure the absorption of charged molecules, enabling determining TPQ Förster radii (2.5–4 nm) from the spectral overlap.
Stan E. A. Jaspars+5 more
wiley +1 more source
Factors to Influence Thermal-Cycling Reliability of Passivation Layers in Semiconductor Devices Utilizing Lead-on-Chip (LOC) Die Attach Technique [PDF]
성민 이, 성란 이
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High‐Entropy Magnetism of Murunskite
The study of murunskite (K2FeCu3S4) reveals that its magnetic and orbital order emerges in a simple I4/mmm crystal structure with complete disorder in the transition metal positions. Mixed‐valence Fe ions randomly occupy 1/4 of the tetrahedral sites, with the remaining 3/4 being filled by non‐magnetic Cu+ ions.
Davor Tolj+18 more
wiley +1 more source
A Self-Supervised Robotic System for Autonomous Contact-Based Spatial Mapping of Semiconductor Properties [PDF]
Integrating robotically driven contact-based material characterization techniques into self-driving laboratories can enhance measurement quality, reliability, and throughput. While deep learning models support robust autonomy, current methods lack reliable pixel-precision positioning and require extensive labeled data.
arxiv