Reliability Characterization of Wide-Bandgap Semiconductor Switches.
Robert Kaplar +4 more
openalex +1 more source
Integrative Approaches for DNA Sequence‐Controlled Functional Materials
DNA is emerging as a programmable building block for functional materials with applications in biomimicry, biochemical, and mechanical information processing. The integration of simulations, experiments, and machine learning is explored as a means to bridge DNA sequences with macroscopic material properties, highlighting current advances and providing ...
Aaron Gadzekpo +4 more
wiley +1 more source
In Situ Raman Measurement of the Growth of SiCOH Thin Film Using Hexamethyl-Disiloxane (HMDSO) Mixture Source in Semiconductor Interconnection. [PDF]
Lee HR, Choi TM, Pyo SG.
europepmc +1 more source
A Study of Nanometer Semiconductor Scaling Effects on Microelectronics Reliability
Mark White
openalex +1 more source
Improving Semiconductor Reliability of Silver Sintering Die-Attach Adhesives for Large Die on Copper Lead Frames [PDF]
Ruud de Wit +5 more
openalex +1 more source
This review highlights how machine learning (ML) algorithms are employed to enhance sensor performance, focusing on gas and physical sensors such as haptic and strain devices. By addressing current bottlenecks and enabling simultaneous improvement of multiple metrics, these approaches pave the way toward next‐generation, real‐world sensor applications.
Kichul Lee +17 more
wiley +1 more source
A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs. [PDF]
Yang X, Hu Z, Bo Y, Shi T, Cui M.
europepmc +1 more source
Mechanotransducing Organic Electrochemical Diode for Crosstalk‐Inhibited Artificial Skin
An innovative approach is presented to a stretchable mechanotransducing diode that unifies rectification and tactile‐sensing functionality. This approach enables to fabricate the diode that maintains a large rectification ratio (5 × 102) at a high operational frequency (100 Hz).
Taeyeong Kim +7 more
wiley +1 more source
High-Temperature Annealing of Random Telegraph Noise in a Stacked CMOS Image Sensor After Hot-Carrier Stress. [PDF]
Chao CY +8 more
europepmc +1 more source

