Results 261 to 270 of about 1,561,898 (299)

Reliability of compound semiconductor devices

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400), 2002
This paper reviews the reliability problems of compound semiconductor devices. These devices suffer from specific failure mechanisms, which are related to their limited maturity. Only the GaAs MESFETs exhibit a stable technology and an assessed reliability. The metallizations employed in HEMTs already benefit from this assessment.
F. Fantini, L. Cattani, D. Dieci
openaire   +1 more source

Reliability Testing of Semiconductor Devices in a Humid Environment

Journal of the IEST, 1993
The influence of humidity on semiconductor device reliability is investigated with two main purposes: to emphasize the role of humidity in the failure process as a stress factor and to model the reliability-humidity relationship. Experiments were performed on two types of plastic encapsulated semiconductor devices (optoelectronic and ICs).
M. Bazu, M. Tazlauanu
openaire   +1 more source

Practical "building-in reliability" approaches for semiconductor manufacturing

IEEE Transactions on Reliability, 2002
To cope with the fast advancement of the semiconductor technology and customers' expectations toward performance, service, delivery, quality and reliability, it is necessary to identify defect lots earlier in the production lines. This makes the conventional package-level reliability tests unsuitable for the modern semiconductor industries due to the ...
Wei-Ting Kary Chen, Charles Hung-Jia Huang   +1 more
openaire   +1 more source

High-Reliability Semiconductor Lasers for Optical Communications

IEEE Journal on Selected Areas in Communications, 1986
InGaAsP/InP buried heterostructure (BH) lasers emitting at 1.3 μm have continued to operate stably for more than 3.3 \times 10^{4} h (3.8 years) at 50-60°C and at an output power of 5 mW/facet. A statistically estimated median lifetime exceeds 106at 50°C. A relatively low activation energy of 0.32 eV is obtained for slow degradation.
Motohisa Hirao, Ken'Ichi Mizuishi, Michiharu Nakamura   +2 more
openaire   +2 more sources

Reliability validation of compound semiconductor foundry processes

Microelectronics Reliability, 2012
Abstract An approach for assessing reliability data provided by compound semiconductor foundries is presented. This approach combines a thorough review of the foundry results with independent accelerated life tests to confirm these results. Examples are provided of cases where these independent test results did not adequately match the results ...
Peter Ersland, Shivarajiv Somisetty
openaire   +2 more sources

Reliability Issue in Compound Semiconductor Heterojunction Devices

1998
The failure mechanisms affecting electron devices based on compound semiconductors are reviewed.
FANTINI F, BORGARINO M, CATTANI L, COVA, Paolo, MENOZZI, Roberto, SALVIATI G, CANALI C, MENEGHESSO G, ZANONI E.   +8 more
openaire   +4 more sources

Reliability Of Ingaasp Semiconductor Lasers

SPIE Proceedings, 1987
The degradation mechanisms and reliability assurance strategies of InGaAsP semiconductor lasers that are currently being used in many commercial lightwave systems are discussed.
openaire   +1 more source

Reliability of Wide Band Gap Power Electronic Semiconductor and Packaging: A Review

Energies, 2022
Yalin Wang, Yi Yin
exaly  

Improvements in semiconductor reliability

Microelectronics Reliability, 1964
openaire   +1 more source

A look at semiconductor reliability

Microelectronics Reliability, 1970
openaire   +1 more source