Results 261 to 270 of about 121,599 (302)

Reliability Of Ingaasp Semiconductor Lasers

SPIE Proceedings, 1987
The degradation mechanisms and reliability assurance strategies of InGaAsP semiconductor lasers that are currently being used in many commercial lightwave systems are discussed.
openaire   +1 more source

Reliability assurance of individual semiconductor components

Proceedings of the IEEE, 1974
Where small numbers of highly reliable semiconductor devices are required, conventional methods of procurement are found to have deficiencies. An approach to procurement is proposed which is cost effective, accommodates new device types, and assures reliability in the individual device.
R.F. Haythornthwaite, A.R. Molozzi, D.V. Sulway   +2 more
openaire   +1 more source

Reliability assessment of power semiconductor devices

2016 19th International Symposium on Electrical Apparatus and Technologies (SIELA), 2016
This paper concerns some issues related to failures that occurred in power semiconductor devices. A review of basic requirements aimed at normal and reliable operation of semiconductor components is done by using reliability prediction approaches and prognostic methods.
Anton Georgiev, Toncho Papanchev, Nikolay Nikolov   +2 more
openaire   +1 more source

A reliability appraisal of semiconductor devices

Proceedings of the IEE - Part B: Electronic and Communication Engineering, 1959
The current problems of assessing the reliability of semiconductor devices are discussed, and reference is made to the order of reliability required in typical applications.The evidence from life tests carried out on devices drawn from production lines of transistors and diodes shows how variations in operating conditions and assessment levels affect ...
R. Brewer, W.W.D. Wyatt
openaire   +1 more source

Semiconductor reliability for the next century

Physics World, 1993
The electronics industry now routinely produces devices with up to 1000 million transistors on a single semiconductor chip and this VLSI (very-large-scale integration) revolution shows no sign of stopping. As computer memory requirements push VLSI microfabrication technologies to new extremes, the next generation of dynamic random access memory (DRAM ...
openaire   +1 more source

Reliability Issue in Compound Semiconductor Heterojunction Devices

1998
The failure mechanisms affecting electron devices based on compound semiconductors are reviewed.
FANTINI, Fausto, BORGARINO, Mattia, L. CATTANI, P. COVA, R. MENOZZI, G. SALVIATI, C. CANALI, G. MENEGHESSO, E. ZANONI   +8 more
openaire   +3 more sources

Reliability of Wide Band Gap Power Electronic Semiconductor and Packaging: A Review

Energies, 2022
Yalin Wang
exaly  

Enhance Reliability of Semiconductor Devices in Power Converters

Electronics (Switzerland), 2020
Minh Hoang Nguyen, Sang-Shin Kwak
exaly  

SEMICONDUCTOR RELIABILITY

1963
openaire   +1 more source

Reliability of semiconductor devices

1959 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1959
openaire   +1 more source