Results 281 to 290 of about 119,011 (331)

Investigation on High-Temperature and High-Field Reliability of NMOS Devices Fabricated Using 28 nm Technology After Heavy-Ion Irradiation. [PDF]

Micromachines (Basel)
Cao Y, Zhang Z, Zhang L, Li M, Su S, Zhang W, Xu Y, Huang D, Liu L, Lv L, Ma X.   +10 more
europepmc   +1 more source

A field-programmable gate array based on wafer-scale 2D semiconductor. [PDF]

Natl Sci Rev
Sun Q, Ao M, Dong X, Shi K, Gou S, Zhu Y, Zhang Z, Zhang J, Hu Y, Sun Z, Chen X, Wang L, Bao W, Zhou P.   +13 more
europepmc   +1 more source

<i>In Situ</i> Atomic-Scale Investigation of Electromigration Behavior in Cu-Cu Joints at High Current Density. [PDF]

ACS Nano
Huang HJ, Wang CH, Wang CH, Shen FC, Yang SC, Ong JJ, Chiu WL, Chang HH, Chen C, Wu WW.   +9 more
europepmc   +1 more source

Interface Thermal Resistance in Heterostructures of Micro-Nano Power Devices: Current Status and Future Challenges. [PDF]

Nanomaterials (Basel)
Shen Y, Fu J, Han F, Li D, Yang B, Tang Y.   +5 more
europepmc   +1 more source

Bridging safety and reliability: evaluating the role of reliability handbooks in functional safety-critical semiconductor applications

Franck Galtié
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Achieving semiconductor equipment reliability

Proceedings. Seventh IEEE/CHMT International Electronic Manufacturing Technology Symposium, 2003
It is noted that the increasing complexity of semiconductor manufacturing processes and the competitiveness of worldwide device production demand step function improvements in production equipment reliability and predictability of its availability for use.
D. Ditmore, J. Stewart, R. Dudley, N. Bright   +3 more
openaire   +1 more source

Elements of semiconductor-device reliability

Proceedings of the IEEE, 1974
Semiconductor-device quality and reliability are discussed in the context of the major factors producing failures, the relationship of process technology and its control to device quality and reliability, the testing procedures used to determine quality levels, and screening procedures that can be employed to segregate certain levels of device quality.
C.G. Peattie, J.D. Adams, S.L. Carrell, T.D. George, M.H. Valek   +4 more
openaire   +1 more source

Improving the Reliability of Semiconductor Converters

Russian Electrical Engineering, 2020
This paper considers the opportunities for improving the reliability of power semiconductor converters by increasing the installed capacity margin and modifying the configuration of power circuit diagrams. As shown by regression analysis, the unit cost of an autonomous voltage inverter with an increase in the installed capacity of the frequency ...
M. E. Korzhavin, A. M. Zhuravlev, M. A. Grigorev   +2 more
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Reliability of semiconductor devices

Physics in Technology, 1976
Report on Metallization systems for semiconductor devices, 13 February 1976 Imperial College, London.
openaire   +1 more source