Electro-Mechanical Characterization of the Dynamic Behavior of Ohmic RF MEMS Switches
, 2010 The influence of the bias signal waveform on the electro-mechanical dynamic response of ohmic RF-MEMS switches is here investigated. Laser Doppler Vibrometer and electrical measurements were performed to characterize the actuation time, as well as ...
BARBATO, MARCO +4 more
core
Low-Voltage and High-Reliability RF MEMS Switch with Combined Electrothermal and Electrostatic Actuation. [PDF]
Micromachines (Basel), 2021 Zhu Y, Pal J.
europepmc +1 more source
Gold coated carbon nanotube surfaces as low force electrical contacts for MEMS devices: part 1
, 2009 An experimental investigation of a gold coated vertically aligned carbon nanotube surfaces is undertaken to determine the limits of the electrical contact performance over a large number of switching cycles under low force conditions and with current ...
Yunus, E.M. +2 more
core
Design and Realization of Loaded- and Reflect-Line X-band RF MEMS Phase Shifters
, 2010 This paper presents some experimental results obtained for RF-MEMS phase shifters in X-band. Two different phase shifters are considered: a loaded-line and a reflect-line phase shifter.
B. Margesin +8 more
core +1 more source
Figure of Merit Enhancement of Laterally Vibrating RF-MEMS Resonators via Energy-Preserving Addendum Frame. [PDF]
Micromachines (Basel), 2022 Workie TB +4 more
europepmc +1 more source
Enhancements of MEMS design flow for Automotive and Optoelectronic applications
, 2010 In the latest years we have been witnesses of a very rapidly and amazing grown of MicroElectroMechanical systems (MEMS) which nowadays represent the outstanding state-of-the art in a wide variety of applications from automotive to commercial, biomedical ...
MARCHETTI, ELEONORA
core
Erratum: Zhu, Y.; Pal, J. Low-Voltage and High-Reliability RF MEMS Switch with Combined Electrothermal and Electrostatic Actuation. Micromachines 2021, 12, 1237. [PDF]
Micromachines (Basel), 2021 Zhu Y, Pal J.
europepmc +1 more source
Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches
, 2006 . RF MEMS series and shunt switches in coplanar waveguide configuration have been tested to check their reliability in terms of the technological yield, the number of cycles and the total time during which they are actuated.
S. Catoni +11 more
core
Plenary Abstracts Session & Oral Presentations
HemaSphere, Volume 10, Issue S1, June 2026.
wiley +1 more source