Badanie szumów RTS w diodach SiC spolaryzowanych w kierunku zaporowym
One of the method of electronic device quality and reliability evaluation is observation of its inherent noise. Generally, the inherent noise of semiconductor device consists of Gaussian (i.e. 1/f, shot noise) and non-Gaussian components (i.e.
Stawarz-Graczyk, B., Szewczyk, A.
core
Testing differential effects of periodicity and predictability in auditory rhythmic cueing of concurrent speech. [PDF]
MacLean J, Zhou M, Bidelman GM.
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Environmental uncertainty shapes human effort learning. [PDF]
Bi R +4 more
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The impact of substrate bias on RTS and flicker noise in MOSFETs operating under switched gate bias
The impact of substrate bias on random telegraph signal (RTS) and flicker noise in MOSFETs operating under switched gate bias is investigated by accurate experiments.
SANGIORGI, ENRICO +5 more
core
Pre-breakdown current fluctuations and RTS noise in reverse-bias-stressed AlGaN/GaN HEMTs
In this contribution we investigate in time domain pre-breakdown current fluctuations during the device degradation between Vcrit (≈ -50V for -2V/2min step-stress) and the breakdown voltage (Vbd≈ 80V), as well as post-stress random telegraph signal (RTS)
G. Strasser +8 more
core
A neurocognitive interactive activation model of semantic priming in lexical decisions. [PDF]
Sokolovič L, Kukolja J, Hofmann M.
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Physical activity enhances theta-periodicity of visual attentional allocation. [PDF]
Che X +3 more
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Performance modelling and enhancement of wireless communication protocols
In recent years, Wireless Local Area Networks(WLANs) play a key role in the data communications and networking areas, having witnessed significant research and development. WLANs are extremely popular being almost everywhere including business,office and
Chatzimisios, Periklis
core
Learning Decouples Accuracy and Reaction Time for Rapid Decisions in a Transitive Inference Task. [PDF]
Munoz F +6 more
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