Results 111 to 120 of about 11,597 (212)

ePoster

open access: yes
European Journal of Neurology, Volume 33, Issue S1, June 2026.
wiley   +1 more source

Badanie szumów RTS w diodach SiC spolaryzowanych w kierunku zaporowym

open access: yes, 2014
One of the method of electronic device quality and reliability evaluation is observation of its inherent noise. Generally, the inherent noise of semiconductor device consists of Gaussian (i.e. 1/f, shot noise) and non-Gaussian components (i.e.
Stawarz-Graczyk, B., Szewczyk, A.
core  

Environmental uncertainty shapes human effort learning. [PDF]

open access: yesPLoS Biol
Bi R   +4 more
europepmc   +1 more source

The impact of substrate bias on RTS and flicker noise in MOSFETs operating under switched gate bias

open access: yes, 2008
The impact of substrate bias on random telegraph signal (RTS) and flicker noise in MOSFETs operating under switched gate bias is investigated by accurate experiments.
SANGIORGI, ENRICO   +5 more
core  

Pre-breakdown current fluctuations and RTS noise in reverse-bias-stressed AlGaN/GaN HEMTs

open access: yes, 2012
In this contribution we investigate in time domain pre-breakdown current fluctuations during the device degradation between Vcrit (≈ -50V for -2V/2min step-stress) and the breakdown voltage (Vbd≈ 80V), as well as post-stress random telegraph signal (RTS)
G. Strasser   +8 more
core  

Performance modelling and enhancement of wireless communication protocols

open access: yes
In recent years, Wireless Local Area Networks(WLANs) play a key role in the data communications and networking areas, having witnessed significant research and development. WLANs are extremely popular being almost everywhere including business,office and
Chatzimisios, Periklis
core  

Learning Decouples Accuracy and Reaction Time for Rapid Decisions in a Transitive Inference Task. [PDF]

open access: yesJ Cogn Neurosci
Munoz F   +6 more
europepmc   +1 more source

Home - About - Disclaimer - Privacy