Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor [PDF]
Sensors, 2023 In this work, the degradation of the random telegraph noise (RTN) and the threshold voltage (Vt) shift of an 8.3Mpixel stacked CMOS image sensor (CIS) under hot carrier injection (HCI) stress are investigated. We report for the first time the significant
Calvin Yi-Ping Chao +6 more
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Human Breast Cancer Cells Demonstrate Electrical Excitability [PDF]
Frontiers in Neuroscience, 2020 Breast cancer is one of the most prevalent types of cancers worldwide and yet, its pathophysiology is poorly understood. Single-cell electrophysiological studies have provided evidence that membrane depolarization is implicated in the proliferation and ...
Mafalda Ribeiro +7 more
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A high-performance training-free pipeline for robust random telegraph signal characterization via adaptive wavelet-based denoising and Bayesian digitization methods [PDF]
Scientific ReportsRandom telegraph signal (RTS) analysis is increasingly important for characterizing meaningful temporal fluctuations in physical, chemical, and biological systems.
Tonghe Bai, Ayush Kapoor, Na Young Kim
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Wide-Dynamic-Range Lead-Free SWIR Image Sensors Based on InAs Thin-Film Quantum-Dot Photodiodes † [PDF]
SensorsThis work presents a monolithically integrated short-wavelength infrared (SWIR) image sensor based on indium arsenide (InAs) quantum dot photodiodes (QDPDs).
Myonglae Chu +22 more
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Multi-Aperture-Based Probabilistic Noise Reduction of Random Telegraph Signal Noise and Photon Shot Noise in Semi-Photon-Counting Complementary-Metal-Oxide-Semiconductor Image Sensor [PDF]
Sensors, 2018 A probabilistic method to remove the random telegraph signal (RTS) noise and to increase the signal level is proposed, and was verified by simulation based on measured real sensor noise.
Haruki Ishida +7 more
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Activation Energy of RTS Noise [PDF]
Radioengineering, 2011 Low frequency noise was measured in silicon MOSFET and GaN and InGaAs based HFET devices with special emphasis on the RTS noise. The RTS (Random Telegraph Signal) dependence on the biasing conditions and temperature was analyzed in order to obtain new ...
J. Pavelka +3 more
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RTS Noise and Dark Current White Defects Reduction Using Selective Averaging Based on a Multi-Aperture System [PDF]
Sensors, 2014 In extremely low-light conditions, random telegraph signal (RTS) noise and dark current white defects become visible. In this paper, a multi-aperture imaging system and selective averaging method which removes the RTS noise and the dark current white ...
Bo Zhang +5 more
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Visualisation Techniques for Random Telegraph Signals in MOSFETs [PDF]
, 2004 In the study of LF noise in MOSFETS, it has become clear that Random Telegraph Signals (RTS) are dominant. When a MOSFET is subjected to large-signal excitation, the RTS noise is influenced.
Hoekstra, Erik +4 more
core +11 more sources
IEEE Photonics Journal, 2022 Single-photon avalanche diodes (SPADs) are widely used for weak light detection due to their high gain and high sensitivity. Unfortunately, SPAD devices have random telegraph signal (RTS) noise during the avalanche transition phase, which makes circuit ...
Jian Yang +5 more
doaj +1 more source
IEEE Journal of the Electron Devices Society, 2021 It is difficult to measure the random telegraph noises (RTN) of MOSFET subthreshold currents at the sub-pA level directly and accurately. In this work, we used a charge integration method similar to the operation of the CMOS image sensors (CIS) to ...
Calvin Yi-Ping Chao +7 more
doaj +1 more source